Books by Keyword: Calibration

Description: Collection of selected, peer reviewed papers from the 11^th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII 2013), July 1-3, 2013, Aachen, Germany.
The 60 papers are grouped as follows:
Chapter 1: Metrology for SI,
Chapter 2: Position & Displacement Metrology,
Chapter 3: Micro- and Nanometrology,
Chapter 4: Macrometrology,
Chapter 5: Optical Metrology,
Chapter 6: Sensors and Actuators,
Chapter 7: Material Properties' Characterization,
Chapter 8: Intelligent Instruments for Automation,
Chapter 9: Management of Measurement Processes,
Chapter 10: Calibration and Machine Tool Performance,
Chapter 11: Trends in Production Technology,
Chapter 12: Measurements, Modeling and Simulation in the Humanitarian Field

Description:

The primary aim of the proceeding is the combined coverage of the electronic test of devices, boards and systems—covering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement at the advanced level. Such an approach enables the engineer to take into account the essential mechanical properties of the material itself and special features of practical implementation, including manufacturing technology, experimental results, and design characteristics.

Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
The present work presents up-to-date contributions to the field of mechanisms, mechanical transmissions, robotics and mechatronics. The topics covered are: kinematics, dynamics, analysis and synthesis, mechanical design, sensors and actuators, intelligent control systems and related applications in planar and spatial mechanisms and mechanical transmissions, biomechanics, serial and parallel robots, mobile robots, tele-operation, haptics, virtual reality and precision mechanics. The results reported here should be of interest to researchers, scientists, industrial experts, teachers and students in the fields of engineering as related to design, control and applications.

Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
The goal of this collection of peer-reviewed papers is to bring together researchers from academia and industry, as well as practitioners, so as to share ideas, problems and solutions related to the multifaceted aspects of Advanced Materials in Microwaves and Optics.

Description: The 3rd International Conference on Precision Instrumentation and Measurement (CPIM 2011) was held in Xiangtan City, China. It served as an excellent opportunity for experts to strengthen academic exchanges and to enhance the development of precision instrumentation and measurement.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
The 129 peer-reviewed papers reveal not only novel ideas and results, and work-in-progress, but will also stimulate future research activities in the area of precision instrumentation and measurement.

Description: This volume of Applied Mechanics and Materials contains the papers presented at the joint 2011 Annual British Society for Strain Measurement Conference and the 2011 Fall Society for Experimental Mechanics Conference.
This is the first time that the two societies have held their conferences together. However, it is the sixth time that the papers from an Annual British Society for Strain Measurement Conference have been published as a collection in a volume of Applied Mechanics and Materials.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
The 82 papers in this volume reflect the diverse nature of Experimental Mechanics, with the emphasis placed on Integrating Simulation and Experimentation for Validation. The papers come from both academia and industry, with more than half of the contributions originating from outside the UK; thus indicating the international flavour of this event.

Description: The peer-reviewed papers making up this book cover the subject areas of: materials and their applications, mechatronics, industrial robotics and automation, machine vision, sensor technology, micro-electronic technology, measure control technologies and intelligent systems, transmission and control of fluids, mechanical control and information processing technology, embedded systems, advanced forming manufacturing and equipment, NEMS/MEMS technology and equipment, micro-electronic packaging technology and equipment, advanced nanocomposite techniques and equipment, power and fluid machinery, energy machinery and equipment, construction machinery and equipment and other related topics. The work constitutes an invaluable guide to the subjects covered.

Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
This second collection on “Advanced Measurement and Test II” is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis … and back to process and design improvement. This will be an invaluable guide to the topics.

Description: Volume is indexed by Thomson Reuters BCI (WoS).
Measurement, rigorously defined as ‘ascertaining the size, amount or degree of a measurand by instrumental comparison with a standard unit or by indirect calculation based upon theory’, is what makes science and technology different to imagination. Measurement is essential in industry, commerce and daily life. In the manufacturing industry in particular, measurement and instrumentation technology play increasingly important roles not only in the traditional field of manufacturing but also in the new fields of micro/nano technology and bioengineering.
This book presents recent advances in the use of measurement and instrumentation in the manufacturing industry. A wide range of topics are covered including: micro/nano-metrology，precision measurements，online and in-process measurements，surface metrology，optical metrology and image processing，bio-measurement, sensor technology，intelligent measurement and instrumentation，uncertainty, traceability and calibration and signal-processing algorithms.

Description: The requirements of high precision and of high-quality components and devices in meeting the needs of modern industry and society in disciplines such as semiconductors, optics, nanotechnology, MEMS, manufacturing, biomedical and environmental engineering, make measurement technology and intelligent instruments (which sense, measure and report), more important than ever, and essential for the rapid development of information technology. Following the lead of the previous five publications (1989, 1993, 1996, 1998, 2001) in the series, “Measurement Technology and Intelligent Instruments”, this book presents the most recent advances in this important field. In all, 123 papers were contributed from many regions of the world; including China, Taiwan (China), Japan, Russia, Hong Kong (China), Germany, Australia, Austria, Canada, Korea, Poland, Slovakia and the UK and US.