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Books by Keyword: Wind Tunnel Test
Books
Edited by:
Xianyan Zhou, Guojing He, Yunlei Fan, Yan Xiao, Sashi K. Kunnath and Giorgio Monti
Online since: January 2013
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
The collection covers a broad spectrum of topics related to civil infrastructure engineering, which range from structural engineering, bridge engineering, geotechnical engineering, wind engineering, tunnels, subways and underground facilities, seismic engineering and disaster prevention and mitigation and protection engineering. The volume provided an excellent opportunity to discuss the challenges we are facing with our ever ageing civil infrastructure.
The collection covers a broad spectrum of topics related to civil infrastructure engineering, which range from structural engineering, bridge engineering, geotechnical engineering, wind engineering, tunnels, subways and underground facilities, seismic engineering and disaster prevention and mitigation and protection engineering. The volume provided an excellent opportunity to discuss the challenges we are facing with our ever ageing civil infrastructure.
Edited by:
Chunliang Zhang and Paul P. Lin
Online since: November 2012
Description: This special volume brings together the latest advances in, and applications of, vibration, structural engineering and measurement.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
It comprises 534 papers selected from the over 800 submitted by universities and industrial concerns all over the world. They specifically cover the topics of vibration engineering, structural engineering, building materials and measurement.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
It comprises 534 papers selected from the over 800 submitted by universities and industrial concerns all over the world. They specifically cover the topics of vibration engineering, structural engineering, building materials and measurement.
Edited by:
Riza Esa and Yanwen Wu
Online since: July 2011
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
This second collection on “Advanced Measurement and Test II” is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis … and back to process and design improvement. This will be an invaluable guide to the topics.
This second collection on “Advanced Measurement and Test II” is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis … and back to process and design improvement. This will be an invaluable guide to the topics.
Showing 1 to 3 of 3 Books