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HomeForward Bias Degradation

Books by Keyword: Forward Bias Degradation

Books

Structural Defects in Silicon Carbide

Edited by: Prof. Victor Veliadis and Dr. Arash Salemi

Online since: September 2025

Description: This special edition provides a focused overview of the state of the art in the areas of control, analysis of characteristics, and effect compensation of silicon carbide structure defects, highlighting the scientific foundations and technological solutions that underpin the development of high-quality SiC devices.