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Structural Defects in Silicon Carbide
Description:
This special edition provides a focused overview of the state of the art in the areas of control, analysis of characteristics, and effect compensation of silicon carbide structure defects, highlighting the scientific foundations and technological solutions that underpin the development of high-quality SiC devices.
Purchase this book:
Print
978-3-0364-0917-7
$105.00
Info:
eBook:
ToC:
Editors:
Prof. Victor Veliadis and Dr. Arash Salemi
THEMA:
TBN, TGM, TJFD
BISAC:
TEC008000, TEC020000, TEC021000
Keywords:
Details:
Special topic volume with invited peer-reviewed papers only
Pages:
88
Year:
2025
ISBN-13 (softcover):
9783036409177
ISBN-13 (eBook):
9783036419176
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Ringgold Subjects:
Materials Science, Manufacturing, Electronics