Description: By combining perspective materials processing techniques, device engineering, and circuit integration methods, this special edition provides a comprehensive overview of the state of the art in SiC-based power electronics device fabrication technologies, serving as a valuable resource for researchers, engineers, and practitioners in the field.

Structural Defects in Silicon Carbide

Edited by: Prof. Victor Veliadis and Dr. Arash Salemi

Online since: September 2025

Description: This special edition provides a focused overview of the state of the art in the areas of control, analysis of characteristics, and effect compensation of silicon carbide structure defects, highlighting the scientific foundations and technological solutions that underpin the development of high-quality SiC devices.

Characteristics of MOSFETs

Edited by: Prof. Victor Veliadis and Dr. Arash Salemi

Online since: September 2025

Description: As a valuable resource for researchers, engineers, and practitioners, this special edition presents a balanced account of the scientific foundations together with the engineering and technological solutions that underpin the advancement and deployment of SiC-based power devices.