Description: This special edition combines issues related to the reliability and stability of silicon carbide-based electronic devices with an analysis of engineering solutions for their applications in frontier technologies and extreme conditions, providing readers with a comprehensive overview of current advances and future directions of applications.

Defects and Characteristics of SiC

Edited by: Prof. Victor Veliadis and Dr. Arash Salemi

Online since: September 2025

Description: By integrating technological features of crystal and epitaxial layer growth, physics of defect occurrence processes and procedures for eliminating their effects, and device engineering, this edition provides a comprehensive overview of the current state of research and existing approaches to mitigating defect-related limitations in SiC-based technologies.

Design and Characteristics of MOSFETs

Edited by: Prof. Victor Veliadis and Dr. Arash Salemi

Online since: September 2025

Description: This special edition comprehensively overviews state-of-the-art technologies for designing structures and analysing functional characteristics of SiC-based devices and integrated circuits, which, in modern conditions of scientific and technological progress, have wide applications in many engineering and manufacturing fields.

Technological Improvements in Devices Fabrication

Edited by: Prof. Victor Veliadis and Dr. Arash Salemi

Online since: September 2025

Description: This special edition provides a comprehensive overview of the latest process enhancements that underpin the continued advancement of SiC-based device technologies by addressing methods of compound semiconductor processing and technologies of electronics device structure forming with a focus on end-device reliability.

Processes in Devices Fabrication

Edited by: Prof. Victor Veliadis and Dr. Arash Salemi

Online since: September 2025

Description: By combining perspective materials processing techniques, device engineering, and circuit integration methods, this special edition provides a comprehensive overview of the state of the art in SiC-based power electronics device fabrication technologies, serving as a valuable resource for researchers, engineers, and practitioners in the field.

Characteristics Evaluation and Device Design

Edited by: Prof. Victor Veliadis and Dr. Arash Salemi

Online since: September 2025

Description: This special edition analyses recent technological advances, modern design methodologies, and performance evaluation and parameters optimisation techniques of SiC-based power devices.

Structural Defects in Silicon Carbide

Edited by: Prof. Victor Veliadis and Dr. Arash Salemi

Online since: September 2025

Description: This special edition provides a focused overview of the state of the art in the areas of control, analysis of characteristics, and effect compensation of silicon carbide structure defects, highlighting the scientific foundations and technological solutions that underpin the development of high-quality SiC devices.

Epitaxial Layer Manufacturing

Edited by: Prof. Victor Veliadis and Dr. Arash Salemi

Online since: September 2025

Description: This special edition is a helpful resource for researchers, engineers, and practitioners involved in developing, designing, and manufacturing next-generation power electronic components. The articles cover both fundamental principles and applied methodologies, offering a balanced perspective on modern semiconductor technology.

Characteristics of MOSFETs

Edited by: Prof. Victor Veliadis and Dr. Arash Salemi

Online since: September 2025

Description: As a valuable resource for researchers, engineers, and practitioners, this special edition presents a balanced account of the scientific foundations together with the engineering and technological solutions that underpin the advancement and deployment of SiC-based power devices.

Substrates and Substrates Manufacturing

Edited by: Prof. Victor Veliadis and Dr. Arash Salemi

Online since: September 2025

Description: This special edition aims to serve as a valuable resource for researchers and engineers engaged in developing and producing advanced semiconductor power devices. The publication provides readers with a balanced view of this field's scientific foundations and applied methodologies.