Books by Keyword: Silicon Carbide

Books

Edited by: Prof. William C. Tang, Dr. Nicuşor Alin Sîrbu, Dr. Josef Kasl and Yves Marcel
Online since: December 2025
Description: This special edition presents recent research results and engineering solutions in materials science and treatment technologies, with an emphasis on innovative processing techniques, the development of technological tools, and emerging applications in modern industries and aims to serve as a valuable reference for researchers and engineers seeking insights into the latest trends and technologies shaping modern materials science.
Edited by: Prof. Efstathios I. Meletis
Online since: December 2025
Description: The 90th volume of the journal features peer-reviewed articles dedicated to recent research results in nanomaterials and applied nanotechnologies across a broad spectrum of potential applications, including microelectronics, optoelectronics, photovoltaics, wastewater treatment, energy storage, pharmaceuticals, and high-performance coatings for machine parts. The presented volume will be helpful for a wide range of readers whose activities are related to the development and applications of nanoscale materials and technologies.
Edited by: Prof. Victor Veliadis and Dr. Arash Salemi
Online since: September 2025
Description: Selected peer-reviewed extended articles based on abstracts presented at the 21 International Conference on Silicon Carbide and Related Materials (ICSCRM 2024).
Edited by: Prof. Victor Veliadis and Dr. Arash Salemi
Online since: September 2025
Description: This special edition combines issues related to the reliability and stability of silicon carbide-based electronic devices with an analysis of engineering solutions for their applications in frontier technologies and extreme conditions, providing readers with a comprehensive overview of current advances and future directions of applications.
Edited by: Prof. Victor Veliadis and Dr. Arash Salemi
Online since: September 2025
Description: By integrating technological features of crystal and epitaxial layer growth, physics of defect occurrence processes and procedures for eliminating their effects, and device engineering, this edition provides a comprehensive overview of the current state of research and existing approaches to mitigating defect-related limitations in SiC-based technologies.
Edited by: Prof. Victor Veliadis and Dr. Arash Salemi
Online since: September 2025
Description: This special edition comprehensively overviews state-of-the-art technologies for designing structures and analysing functional characteristics of SiC-based devices and integrated circuits, which, in modern conditions of scientific and technological progress, have wide applications in many engineering and manufacturing fields.
Edited by: Prof. Victor Veliadis and Dr. Arash Salemi
Online since: September 2025
Description: This special edition provides a comprehensive overview of the latest process enhancements that underpin the continued advancement of SiC-based device technologies by addressing methods of compound semiconductor processing and technologies of electronics device structure forming with a focus on end-device reliability.
Edited by: Prof. Victor Veliadis and Dr. Arash Salemi
Online since: September 2025
Description: By combining perspective materials processing techniques, device engineering, and circuit integration methods, this special edition provides a comprehensive overview of the state of the art in SiC-based power electronics device fabrication technologies, serving as a valuable resource for researchers, engineers, and practitioners in the field.
Edited by: Prof. Victor Veliadis and Dr. Arash Salemi
Online since: September 2025
Description: This special edition analyses recent technological advances, modern design methodologies, and performance evaluation and parameters optimisation techniques of SiC-based power devices.
Edited by: Prof. Victor Veliadis and Dr. Arash Salemi
Online since: September 2025
Description: This special edition provides a focused overview of the state of the art in the areas of control, analysis of characteristics, and effect compensation of silicon carbide structure defects, highlighting the scientific foundations and technological solutions that underpin the development of high-quality SiC devices.
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