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Books by Keyword: LabVIEW
Books
Edited by:
Wu Fan
Online since: November 2011
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
The objective of ICMST 2011 was to provide a platform where researchers, engineers, academics and industrial professionals from all over the world could present their research results and discuss developments in Manufacturing Science and Technology. This conference provided opportunities for delegates to exchange new ideas and applications face-to-face, to establish business or research contacts and to find global partners for future collaboration.
The objective of ICMST 2011 was to provide a platform where researchers, engineers, academics and industrial professionals from all over the world could present their research results and discuss developments in Manufacturing Science and Technology. This conference provided opportunities for delegates to exchange new ideas and applications face-to-face, to establish business or research contacts and to find global partners for future collaboration.
Edited by:
Dongye Sun, Wen-Pei Sung and Ran Chen
Online since: October 2011
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
This collection of 949 peer-reviewed papers on the Frontiers of Manufacturing and Design Science is intended to promote the development of Manufacturing, Design and Materials Science, the strengthening of international academic cooperation and communications and the exchange of research ideas. This book provides readers with a broad overview of the latest advances in the field of Manufacturing and Design Science.
This collection of 949 peer-reviewed papers on the Frontiers of Manufacturing and Design Science is intended to promote the development of Manufacturing, Design and Materials Science, the strengthening of international academic cooperation and communications and the exchange of research ideas. This book provides readers with a broad overview of the latest advances in the field of Manufacturing and Design Science.
Edited by:
Liangchi Zhang, Chunliang Zhang and Zichen Chen
Online since: September 2011
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
This special volume brings together the latest advances in, and applications of, mechatronics and materials processing. It comprises 523 papers selected from the some 1000 papers originally submitted by universities and industrial concerns all over the world. The papers specifically cover the topics of manufacturing technology and processing, materials science and technology, mechatronics and automation. All of the papers were peer-reviewed, by selected experts, and chosen for their quality and relevance. This work will provide readers with a broad overview of the latest advances in the field of mechatronics and materials processing. It will also constitute a valuable reference work for researchers in the fields of mechatronics and materials processing.
This special volume brings together the latest advances in, and applications of, mechatronics and materials processing. It comprises 523 papers selected from the some 1000 papers originally submitted by universities and industrial concerns all over the world. The papers specifically cover the topics of manufacturing technology and processing, materials science and technology, mechatronics and automation. All of the papers were peer-reviewed, by selected experts, and chosen for their quality and relevance. This work will provide readers with a broad overview of the latest advances in the field of mechatronics and materials processing. It will also constitute a valuable reference work for researchers in the fields of mechatronics and materials processing.
Edited by:
Riza Esa and Yanwen Wu
Online since: July 2011
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
This second collection on “Advanced Measurement and Test II” is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis … and back to process and design improvement. This will be an invaluable guide to the topics.
This second collection on “Advanced Measurement and Test II” is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis … and back to process and design improvement. This will be an invaluable guide to the topics.
Edited by:
Fei Hu and Beibei Wang
Online since: July 2011
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
During the past few years, mechanics, solid-state phenomena and engineering materials have played important roles in the progress of human society, and scholarly research in the related fields has accumulated a treasury of accomplishments and has promoted the development of academic studies. Meanwhile, researchers are faced with many problems. This collection of 84 peer-reviewed papers is divided into sections on solid materials, solid mechanics and related topics. The volume will be essential reading for those working in the related areas and will provide the inspiration for future studies and advances.
During the past few years, mechanics, solid-state phenomena and engineering materials have played important roles in the progress of human society, and scholarly research in the related fields has accumulated a treasury of accomplishments and has promoted the development of academic studies. Meanwhile, researchers are faced with many problems. This collection of 84 peer-reviewed papers is divided into sections on solid materials, solid mechanics and related topics. The volume will be essential reading for those working in the related areas and will provide the inspiration for future studies and advances.
Edited by:
Helen Zhang, Gang Shen and David Jin
Online since: April 2011
Description: In this special collection of over 304 peer-reviewed papers, are to be found some original ideas and angles on every aspect of Automation, Communication, Architectonics and Materials. Researchers here exchange their innovative ideas and new perspectives. The book will provide invaluable guidance to scientists, physicists, chemists and teachers concerning the topics covered.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
Volume is indexed by Thomson Reuters CPCI-S (WoS).