Description: This book constitutes a comprehensive international forum on defect-related phenomena in wide-gap materials, crystalline or otherwise. Materials as diverse as SiO2, group-III nitride compounds, diamond, alkali halides, refractory oxides, and polymers are covered, and the "defects" considered include intrinsic point imperfections, dislocations, accidental impurities, intentional dopants, imperfect surfaces, nanocrystals in host matrices, and bonding defects in glasses.
Important unifying similarities of the phenomena are identified and investigative methods are presented which can be applied, almost across-the-board, to materials which share a wide transparency, deep traps, extensive stored energy in electron-hole pairs, and a low conduction-electron density.

II-VI Compounds and Semimagnetic Semiconductors

Edited by: H. Heinrich and J.B. Mullin

Online since: February 1995

Description: The main emphasis of this volume is on the fundamental physics of the II-VI compounds focusing on the properties of epitaxial layers, heterostructures, multilayers and superlattices.

Physical Chemistry of Solid State Materials

Edited by: M. Zahir

Online since: September 1994

Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
This book presents most recent advances in the physical chemistry of solid state materials. The range of topics covers various methods of preparing solid state materials, their physical properties as well as industrial applications.

Defects in Semiconductors 17

Edited by: Helmut Heinrich and Wolfgang Jantsch

Online since: October 1993

Description: This comprehensive issue presents 297 papers that cover a broad range of topics in the fundamental science of imperfections in semiconductor materials including the creation and/or origin, structure, electronic, optical, thermodynamical and chemical properties of defects, often also with strong relevance to technological problems in semiconductor devices.

Shallow Impurities in Semiconductors V

Edited by: Tsunemasa Taguchi

Online since: January 1993

Description: The volume presents the proceedings of the 5th International Conference on Shallow Impurities in Semiconductors, held in Kobe, Japan, August 1992.