Books by Keyword: Metal

Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
Collection of selected, peer reviewed papers from the 3rd International Conference on Materials and Products Manufacturing Technology (ICMPMT 2013), September 25-26, 2013, Guangzhou, China.
The 402 papers are grouped as follows:
Chapter 1: Micro/Nano Materials and Films;
Chapter 2: Polymer Materials;
Chapter 3: Composites;
Chapter 4: Ceramic;
Chapter 5: Metal, Alloys and Mining Engineering;
Chapter 6: Chemical Materials;
Chapter 7: Biomaterials and Technology;
Chapter 8: Surface Engineering/Coatings;
Chapter 9: Building Materials, Construction and Architecture;
Chapter 10: Material Processing Technology;
Chapter 11: Sensors and Detecting Technology;
Chapter 12: Signal and Intelligent Information Processing;
Chapter 13: Electronic, Optoelectronic and Automation;
Chapter 14: Industrial Robotics and Mechatronics;
Chapter 15: Mechanical Design and Modeling;
Chapter 16: CAD/CAM/CAE;
Chapter 17: Product Design and Manufacture;
Chapter 18: Advanced Manufacturing Technology;
Chapter 19: Computer Applications and Mathematical Modeling;
Chapter 20: Industrial Engineering and System Analysis;
Chapter 21: Engineering Management and Engineering Education

Description: The 64 peer-reviewed papers collected here together offer a plenitude of up-to-date information on “Novel Routes for Ceramics Synthesis and Processing”. The papers are conveniently arranged into the SOFT SOLUTION PROCESSING, SPARK PLASMA AND MICROWAVE SYNTHESIS AND SINTERING, HYBRID MATERIALS, POROUS CERAMICS, SHS CERAMICS, SHS of Ceramic Powders, Fabrication of SHS Products and Application Issues, LAYERED AND FUNCTIONALLY GRADED MATERIALS, OTHER PROCESSING ROUTES.

Description: Diffusion-controlled processes still remain the most important and interesting phenomena in materials science. Among the problems which are currently to the fore, are the synergy of diffusion and morphological evolution, the initial stages of solid-state reactions, the analysis of nano- materials and related phenomena, thermo- and electromigration, and the reliability of solder joints and interconnects in microelectronic devices. A number of challenging problems still remain within the “classical” areas of nucleation, reactive- and inter-diffusion, phase growth in multicomponent and binary systems, and decomposition and ripening.
Volume is indexed by Thomson Reuters CPCI-S (WoS)

Description: Continuing the scope of the preceding Conferences on Intergranular and Interphase Boundaries in Materials, the present conference focused on the atomic-level modeling of interfaces, the structural and chemical characterization of internal interfaces, on their thermodynamic, kinetic, mechanical, electrical, magnetic behavior and high-Tc superconductivity, and on the application of current knowledge to the design of polycrystalline materials having improved properties. Particular attention was paid to non-equilibrium segregation in irradiated materials.
Volume is indexed by Thomson Reuters CPCI-S (WoS).

Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
Modern Technology depends upon modern materials. Life as we know it would hardly be possible without the progress that has been made in cutting edge materials science. This is true of both the various theoretical aspects and of the practical engineering applications.

Description: Modern technology depends upon advanced materials. Life as we know it would hardly be possible without the highly specialized knowledge that has resulted from the extensive scientific research of the 20th Century.

Description:

The proceedings of an International Conference "Diffusion in Metals and Alloys" (DIMETA-82, Hungary, September 1982) are related to physical metallurgy and are dedicated to researching various types of diffusion processes in metals and alloys, intermetallic compounds, amorphous metals, and heterogeneous systems. There are articles in this issue also devoted to grain boundary and surface diffusion phenomena, crystallographic defects, and novel experimental methods of diffusion phenomena study.

Description: Defect and Diffusion Forum Vol. 32

Description: Defect and Diffusion Forum Vol. 30