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Books by Keyword: Synchrotron Radiation (XRD)
Books
Edited by:
Y. Akiniwa, K. Akita and H. Suzuki
Online since: May 2010
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
Neutron and synchrotron radiation are novel and powerful tools for stress evaluation, and are widely applied to fundamental studies in materials science and engineering, and in various industrial fields. This volume brings together the up-to-date knowledge of scientists from the academic world and industry in order to address specific topics concerning the evaluation of stresses and related phenomena using neutrons, synchrotron radiation and X-rays. Many of the presentations on stress-testing deal with samples of up to 0.5m line-pipe. Many applications of micro-beam X-ray methods are described, ranging from intragranular stress fluctuations within a grain (attributed to dislocations) to stresses in interconnects on chips. Simultaneous evaluation of tomographic and stress measurements of the same sample was shown to provide extremely clear insights into the nature and cause of damage. A major advance in the simulation of stress and strain at the mesoscopic scale has been achieved using the extended elasto-plastic self-consistent model. Such discoveries, and many others, will make this an important reference work for anyone who uses these techniques.
Neutron and synchrotron radiation are novel and powerful tools for stress evaluation, and are widely applied to fundamental studies in materials science and engineering, and in various industrial fields. This volume brings together the up-to-date knowledge of scientists from the academic world and industry in order to address specific topics concerning the evaluation of stresses and related phenomena using neutrons, synchrotron radiation and X-rays. Many of the presentations on stress-testing deal with samples of up to 0.5m line-pipe. Many applications of micro-beam X-ray methods are described, ranging from intragranular stress fluctuations within a grain (attributed to dislocations) to stresses in interconnects on chips. Simultaneous evaluation of tomographic and stress measurements of the same sample was shown to provide extremely clear insights into the nature and cause of damage. A major advance in the simulation of stress and strain at the mesoscopic scale has been achieved using the extended elasto-plastic self-consistent model. Such discoveries, and many others, will make this an important reference work for anyone who uses these techniques.
Edited by:
A. R. Pyzalla, A. Borbély and H.-P. Degischer
Online since: March 2008
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
This collection addresses specific topics within the field of stress measurement in solids using neutrons, X-rays and synchrotron radiation. Particular attention is paid to multidisciplinary approaches involving an understanding of the measured stress field and the implications of the stress field for the behaviour of materials and components.
This collection addresses specific topics within the field of stress measurement in solids using neutrons, X-rays and synchrotron radiation. Particular attention is paid to multidisciplinary approaches involving an understanding of the measured stress field and the implications of the stress field for the behaviour of materials and components.
Edited by:
W. Reimers and S. Quander
Online since: September 2006
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
The Seventh European Conference on Residual Stresses (ECRS7), was held in Berlin, Germany, on the 13-15th September 2006.
The Seventh European Conference on Residual Stresses (ECRS7), was held in Berlin, Germany, on the 13-15th September 2006.
Edited by:
Sabine Denis, Takao Hanabusa, Bob Baoping He, Eric Mittemeijer, JunMa Nan, Ismail Cevdet Noyan, Berthold Scholtes, Keisuke Tanaka, KeWei Xu
Online since: July 2005
Description: The field of Residual Stresses is surprisingly large, and also highly interdisciplinary in nature, both with regard to its applications and to its scientific and technological fundamentals.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
Volume is indexed by Thomson Reuters CPCI-S (WoS).
Edited by:
A.R. Yavari, A. Inoue, D. Morris and R. Schulz
Online since: May 2003
Description: This volume is available electronically only. Please consult http://www.scientific.net/jmnm
Edited by:
A.M. Dias, J. Pina, A.C. Batista and E. Diogo
Online since: August 2002
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
The field of Residual Stresses is a very large one and is also highly interdisciplinary in nature with regard both to its applications and to its scientific and technological fundamentals. The highly successful aim of this Conference (ECRS6) was to bring together researchers and practicing engineers, academics and students from all of the European Community members; as well as guests from overseas.
The field of Residual Stresses is a very large one and is also highly interdisciplinary in nature with regard both to its applications and to its scientific and technological fundamentals. The highly successful aim of this Conference (ECRS6) was to bring together researchers and practicing engineers, academics and students from all of the European Community members; as well as guests from overseas.
Edited by:
R. Delhez and E.J. Mittemeijer
Online since: April 1998
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
The EPDIC-5 Proceedings present the latest papers in this successful series of European Conferences on Powder Diffraction. They demonstrate the evergrowing interest from materials scientists, physicists, chemists, geologists - both industrial and academic- all having a direct interest in the practical application of this powerful and non-destructive method of analysis.
Part 1 comprises some 75 contributions, with sections on Methodological Developments, Development of Instruments and Techniques, Software, Synchrotron and Neutron Diffraction describing the latest ideas in these fields. Subjects such as Microstructure of Materials, Texture, Quantitative Phase Analysis and Crystal Structure Determination are also addressed; as in previous editions of these conference proceedings. An important step forward in materials analysis is now occurring: scientists and engineers are becoming more and more conscious of the fact that, by using these techniques, it is possible to obtain quantitative information from the same set of measurements, of material characteristics, that determine material properties. This advance has been made possible thanks to recent instrumental developments, such as the X-ray lens -a bundle of glass capillaries- and single or double X-ray mirrors. A very useful tool, that is extensively applied -as described in a sequence of some 15 contributions-, is the in-situ (i.e. time resolved) powder diffraction technique which has resulted from the ample availability of position sensitive detectors.
The EPDIC-5 Proceedings present the latest papers in this successful series of European Conferences on Powder Diffraction. They demonstrate the evergrowing interest from materials scientists, physicists, chemists, geologists - both industrial and academic- all having a direct interest in the practical application of this powerful and non-destructive method of analysis.
Part 1 comprises some 75 contributions, with sections on Methodological Developments, Development of Instruments and Techniques, Software, Synchrotron and Neutron Diffraction describing the latest ideas in these fields. Subjects such as Microstructure of Materials, Texture, Quantitative Phase Analysis and Crystal Structure Determination are also addressed; as in previous editions of these conference proceedings. An important step forward in materials analysis is now occurring: scientists and engineers are becoming more and more conscious of the fact that, by using these techniques, it is possible to obtain quantitative information from the same set of measurements, of material characteristics, that determine material properties. This advance has been made possible thanks to recent instrumental developments, such as the X-ray lens -a bundle of glass capillaries- and single or double X-ray mirrors. A very useful tool, that is extensively applied -as described in a sequence of some 15 contributions-, is the in-situ (i.e. time resolved) powder diffraction technique which has resulted from the ample availability of position sensitive detectors.
Edited by:
Robert J. Cernik, R. Delhez and Prof. Eric Jan Mittemeijer
Online since: July 1996
Description: This comprehensive publication presents most recent results, and covers practically all aspects of powder diffraction. Part 1 contains contributions dealing with powder diffraction methods, and the larger second part comprises contributions which deal with the application of powder-diffraction methods to specific problems in the physics and chemistry of solids.
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