The field of Residual Stresses is surprisingly large, and also highly interdisciplinary in nature, both with regard to its applications and to its scientific and technological fundamentals.
Volume is indexed by Thomson Reuters CPCI-S (WoS).

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eBook:

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ToC:

Table of contents

Editors:

Sabine Denis, Takao Hanabusa, Bob Baoping He, Eric Mittemeijer, JunMa Nan, Ismail Cevdet Noyan, Berthold Scholtes, Keisuke Tanaka, KeWei Xu

DOI:

https://doi.org/10.4028/b-DNk1Zf

THEMA:

TGM

BISAC:

TEC021000

Keywords:

Fatigue, Finite Element Model (FEM), Neutron Diffraction, Residual Stress, Synchrotron Radiation (XRD), Thin Film

Details:

Proceedings of the 7th International Conference on Residual Stresses, ICRS-7, X’ian, China, 14-17 June 2004

Pages:

724

Year:

2005

ISBN-13 (softcover):

9780878499694

ISBN-13 (CD):

9783035719352

ISBN-13 (eBook):

9783038130079

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