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Books by Keyword: Transmission Electron Microscopy (TEM)
Books
Edited by:
Ramiro Pérez Campos, Antonio Contreras Cuevas and Rodrigo A. Esparza Muñoz
Online since: April 2013
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
This special volume of 24 peer reviewed contributions cover up-to-date research results on "Structural and Chemical Characterization of Metals Alloys and Compounds". The structural and chemical characterization of different materials such as metals, alloys, ceramics, steels, composites, polymeric compounds, welding, superalloys, intermetallic compounds, and nanomaterials are included. They were prepared with different techniques. Some important topics addressed were the analytical techniques focused on the microstructural, chemical, optical, electronic, magnetic and mechanical properties of materials.
This special volume of 24 peer reviewed contributions cover up-to-date research results on "Structural and Chemical Characterization of Metals Alloys and Compounds". The structural and chemical characterization of different materials such as metals, alloys, ceramics, steels, composites, polymeric compounds, welding, superalloys, intermetallic compounds, and nanomaterials are included. They were prepared with different techniques. Some important topics addressed were the analytical techniques focused on the microstructural, chemical, optical, electronic, magnetic and mechanical properties of materials.
Edited by:
Dr. Amir Al-Ahmed
Online since: May 2012
Description: This periodical publishes research and review articles on hybrid nanomaterials such as inorganic-organic, inorganic-inorganic and organic-organic. It focuses on all aspects of nanoscience, nanotechnology and composites.
Edited by:
Danuta Stróż and Krystian Prusik
Online since: March 2012
Description: These are the proceedings of the XIV International Conference on Electron Microscopy (EM2011) held in Wisła, Poland from the 26 to 30th June 2011. The goal of the conference was to provide a forum where researchers from many different countries could exchange their latest advances in the field of structural studies, regarding the use of electron microscopic techniques as applied to various materials. Plenary and invited lectures offered overviews of exciting new developments which highlighted the applications of new electron microscopic techniques in physics, chemistry, materials science and in life and earth sciences.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
The papers cover topics such as electron, holography, tomography, HREM, STEM, EBSD, ED and precession techniques - as well as their application to materials science and related disciplines.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
The papers cover topics such as electron, holography, tomography, HREM, STEM, EBSD, ED and precession techniques - as well as their application to materials science and related disciplines.
Edited by:
T. Chandra, M. Ionescu and D. Mantovani
Online since: November 2011
Description: This supplemental volume presents additional proceedings of the 7th International Conference on Processing and Manufacturing of Advanced Materials - THERMEC’2011 - which was held during the 1-5 August 2011 in Quebec City, Canada. The conference brought together researchers and engineers/technologists working on aspects of the processing, fabrication, evaluation and applications of ferrous and non ferrous materials including biomaterials, and smart/intelligent materials, and the contents reflect the latest progress made in these fields.
Edited by:
W. Jantsch and F. Schäffler
Online since: August 2011
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
The papers contained herein cover the most important and timely issues in the field of “Gettering and Defect Engineering in Semiconductor Technology”, ranging from the theoretical analysis of defect problems to practical engineering solutions, with the emphasis on Si-based materials. Apart from the traditional topics of defect and materials engineering, characterization, modeling and simulation, and the co-integration of various material classes, topics such as materials for solar cells and photonics are discussed. Defects in graphene and in nanocrystals and nanowires are also treated, making this a very up-to-date survey of the field.
The papers contained herein cover the most important and timely issues in the field of “Gettering and Defect Engineering in Semiconductor Technology”, ranging from the theoretical analysis of defect problems to practical engineering solutions, with the emphasis on Si-based materials. Apart from the traditional topics of defect and materials engineering, characterization, modeling and simulation, and the co-integration of various material classes, topics such as materials for solar cells and photonics are discussed. Defects in graphene and in nanocrystals and nanowires are also treated, making this a very up-to-date survey of the field.
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