Engineering Research
Materials Science
Engineering Series
Electron Microscopy XIV
Description:
Volume is indexed by Thomson Reuters CPCI-S (WoS).
The papers cover topics such as electron, holography, tomography, HREM, STEM, EBSD, ED and precession techniques - as well as their application to materials science and related disciplines.
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Review from Ringgold Inc., ProtoView:
Researchers from different countries exchange recent experiences in structural studies that use electron microscopy techniques on many different materials. Among 77 papers are discussions of the art and application of large angle convergent beam electron diffraction, near grain boundary behavior of aluminum bicrystals deformed in plane strain conditions, the structure and morphology of thin films deposited by pulsed laser deposition techniques, the positive hydrogen effect in structure surface layers on titanium alloys, and microstructural changes induced during the hydrogen charging process in stainless steels with and without nitrided layers.