Advanced Techniques for Materials Characterization

Advanced Techniques for Materials Characterization

Description:

Volume is indexed by Thomson Reuters BCI (WoS).
Nowadays, an impressively large number of powerful characterization techniques is being used by physicists, chemists, biologists and engineers in order to solve analytical research problems; especially those related to the investigation of the properties of new materials for advanced applications. Although there are a few available books which deal with such experimental techniques, they are either too exhaustive and cover very few techniques or are too elementary to provide a solid basis for learning to use the characterization technique. Moreover, such books usually over-emphasize the textbook approach: being full of theoretical concepts and mathematical derivations, and omitting the practical instruction required in order to permit newcomers to use the techniques.

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Info:

Authors:
A. K. Tyagi, Mainak Roy, S. K. Kulshreshtha and S. Banerjee
THEMA:
TGM
BISAC:
SCI077000
Pages:
528
Year:
2009
Volume in the series:
49-51
ISBN-13 (softcover):
9780878493791
ISBN-13 (CD):
9780878491711
ISBN-13 (eBook):
9783038133230
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Review from Ringgold Inc., ProtoView: A team of Indian chemists, materials scientists, and a metallurgist set out the procedures for characterizing new and advanced materials that researchers in any science can use to record and present data in a format that is recognized and can be used in other sciences. They cover diffraction, spectroscopic, compositional characterization, synchrotron and surface, and microscopic techniques. Among the specific topics are studying nuclear and magnetic structures using neutron scattering, insights from solid state nuclear magnetic resonance into structural aspects of zeolites and oxide glasses, the compositional characterization of surfaces with ion beam analysis, synchrotron radiation, and characterizing nanostructures by transmission electron microscopy.