Atomic Migration and Defects in Materials

Atomic Migration and Defects in Materials

Description:

The book covers various aspects of of diffusion: its fundamental nature, methodology of experimental and analytical techniques, and implications in modern technology.

Purchase this book:

eBook
978-3-0357-0647-5
$187.00 *
Print
978-3-908044-07-9
$187.00
not available
eBook+Print
978-3-908044-07-9
$299.20 *
not available
* 1-User Access (Single User-Price). For Multi-User-Price please fill a contact form

Info:

Editors:
D. Gupta, H. Jain and R.W. Siegel
THEMA:
TGM
BISAC:
TEC021000
Details:
Proceedings of the ASM Symposium on Atomic Migration and Defects in Materials, Indianapolis, USA, October 1989
Pages:
254
Year:
1991
ISBN-13:
9783908044079
ISBN-13 (CD):
9783038599630
ISBN-13 (eBook):
9783035706475
Permissions CCC:
Permissions PLS:
Share: