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Atomic Migration and Defects in Materials
Description:
The book covers various aspects of of diffusion: its fundamental nature, methodology of experimental and analytical techniques, and implications in modern technology.
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Info:
eBook:
ToC:
Editors:
D. Gupta, H. Jain and R.W. Siegel
THEMA:
TGM
BISAC:
TEC021000
Keywords:
Details:
Proceedings of the ASM Symposium on Atomic Migration and Defects in Materials, Indianapolis, USA, October 1989
Pages:
254
Year:
1991
ISBN-13:
9783908044079
ISBN-13 (CD):
9783038599630
ISBN-13 (eBook):
9783035706475
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