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Diffusion Foundations and Materials Applications
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Defect and Diffusion Forum Vols. 131-132
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Info:
eBook:
ToC:
Editors:
Prof. Graeme E. Murch
THEMA:
TGM, TJ
BISAC:
TEC008000, TEC021000
Keywords:
AlGaAs, Computer Simulation, Crystal Growth, Defect, Diffusion, Electrical Characterisation, Electronic States, Elemental Semiconductors, H-Dopant Complexes, Hydrogen, III-V Compound Semiconductors, II-VI Compound Semiconductors, Infrared Absorption Spectroscopy, InP, Metallic Impurity, Metastability, Optoelectronics, Radiation Damage, Silicon, YBCO Superconductor
Pages:
285
Year:
1996
ISBN-13:
9783908450917
ISBN-13 (CD):
9783035729986
ISBN-13 (eBook):
9783035739985
Permissions CCC:
Permissions PLS:
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