This seventh volume in the series covering the latest results in the field includes abstracts of papers which appeared between the publication of Annual Retrospective VI (Volumes 221-223) and the end of September 2004 (allowing for vagaries of journal availability).

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eBook:

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ToC:

Table of contents

Editors:

Dr. David J. Fisher

DOI:

https://doi.org/10.4028/b-P3kJBa

THEMA:

TGM

BISAC:

TEC021000

Keywords:

Carbon, Classification, Clustering of Dopant Atoms, Defect, Dislocation, DX Centers, Gallium Nitride (GaN), Grown-In Microdefects, Interaction Defect Impurity, Nitrogen, Nitrogen Doping, Oxygen, Referential Inspection, Semiconductor, Silicon, Staebler-Wronski Effect, Surface Morphology, Theory, Vacancy, Void

Pages:

540

Year:

2004

ISBN-13 (softcover):

9783908451044

ISBN-13 (CD):

9783035709551

ISBN-13 (eBook):

9783035707397

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