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Defects and Diffusion in Semicondutors, 2009
Subtitle:
An Annual Retrospective XI
Description:
This eleventh volume in the series covering the latest results in the field includes abstracts of papers which have appeared since the publication of Annual Retrospective X (Volume 272). As well as the 295 metals abstracts, the issue includes – in line with the new editorial policy of including original papers on all of the major material groups: “Structural and Electron-Hopping Studies of Pr- and Nd-Substituted La2/3Ba1/3MnO3 Manganites” (H.Abdullah and S.A.Halim), “Recrystallization Annealing of Cold-Rolled 9Cr-1Mo Ferritic Steel Containing Silicon” (M.N.Mungole, M.Surender, R.Balasubramaniam and S.Bhargava), “Quantitative Concept for Morphological Stability Analysis of Solid/Liquid Interface in Rapid Solidification of Dilute Binary Alloys” (M.Draissia), “Studies of the Spin Hamiltonian Parameters for NiX2 and CdX2:Ni2+ (X = Cl, Br) (Z.H.Zhang, S.Y.Wu, X.F.Wang and Y.X.Hu).
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Info:
eBook:
ToC:
Editors:
Dr. David J. Fisher
THEMA:
TGM
BISAC:
TEC021000
Keywords:
Arrhenius -Type Law Activation Energy (Ea), CdX2 (X=Cl, Br), Cold Rolling, Crystal Field, Diffusion, Electron Paramagnetic Resonance (EPR), Ferritic Steel, Liquid-Solid Interfaces, Mechanical Property, Meta-Insulator Transistor Temperature (Tp), Microstructure, Miscibility, Ni2+, NiX2, Recrystallisation Annealing, Resistivity (ρ), Solidification, Spin Hamiltonians, Undercooling
Pages:
184
Year:
2008
ISBN-13 (softcover):
9783908451631
ISBN-13 (CD):
9783908451631
ISBN-13 (eBook):
9783038132080
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