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Defects of Solid Semiconductor Structures
Description:
This special edition addresses one of the most critical aspects of semiconductor technology: the presence and impact of defects within solid semiconductor materials on the performance and reliability of electronic devices. The presented edition will be useful to researchers and engineers in the semiconductor industry and will serve as an essential resource for those looking to deepen their understanding of the nature of defects in semiconductor structures and their influences on the efficiency and reliability of power electronic devices.
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978-3-0364-1635-9
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978-3-0364-0635-0
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Info:
eBook:
ToC:
Editors:
Prof. Michele Riccio, Prof. Andrea Irace and Prof. Giovanni Breglio
THEMA:
PDT, TGM, TJ
BISAC:
SCI050000, TEC008000, TEC021000
Keywords:
Details:
Special topic volume with invited peer-reviewed papers only
Pages:
196
Year:
2024
ISBN-13 (softcover):
9783036406350
ISBN-13 (eBook):
9783036416359
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Ringgold Subjects:
Materials Science, Electronics, Nanoscience