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HomeMaterials Science ForumMaterials Science Forum Vols. 408-412Rietveld Texture and Stress Analysis of Thin Films...

Rietveld Texture and Stress Analysis of Thin Films by X-Ray Diffraction

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Textures of Materials - ICOTOM 13

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Periodical:

Materials Science Forum (Volumes 408-412)

Pages:

1603-1608

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.408-412.1603

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Online since:

August 2002

Authors:

Luca Lutterotti, Siegfried Matthies, Daniel Chateigner, Sandro Ferrari, Jesús Ricote

Keywords:

Diffraction, Residual Stress, Rietveld, Texture, Thin Film

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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