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Grain Boundary Character Distribution in Rapidly Solidified and Annealed Silicon Ribbons
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Decomposition and Microstructure during Crystallization of Amorphous Ge_xSi_1-x Films
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HomeSolid State PhenomenaSolid State Phenomena Vols. 37-38Decomposition and Microstructure during...

Decomposition and Microstructure during Crystallization of Amorphous Ge_xSi_1-x Films

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Polycrystalline Semiconductors III

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Periodical:

Solid State Phenomena (Volumes 37-38)

Pages:

323-328

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.37-38.323

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Online since:

March 1994

Authors:

F. Edelman, Y. Komem, P. Werner, J. Heydenreich, S.S. Iyer

Keywords:

Amorphous, Crystallization, Decomposition, Film, Superlattice, TEM, X-Ray Diffraction (XRD)

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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