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Defects and Diffusion in Semiconductors

Defect and Diffusion Forum Volumes 162 - 163

• Papers
• Abstracts

• p1 Defect Distribution on Epilayer/Sustrate Interfaces of ISOVPE-MCT Films   [ 1 M ]
  Authors: U. Gilabert, A.B. Trigubó, R. González, N.E. Walsöe de Reca
• p21 Defects in Implanted Hg_1-xCd_xTe: Electrical and Structural Characterization   [ 166 K ]
  Authors: M.H. Aguirre, H. Cánepa, E. Heredia, N.E. Walsöe de Reca
• p27 Dislocations in GaAs: Their Impact on Electronic and Atomic Processes   [ 961 K ]
  Authors: T. Wosiński, T. Figielski
• p43 Electronic Structures of Dangling-Bond Structures Fabricated on Hydrogen-Terminated Si(100)-2 x 1 Surfaces   [ 799 K ]
  Authors: T. Hitosugi, T. Hashizume, S. Heike, H. Kajiyama, Y. Wada, S. Watanabe, T. Hasegawa, Koichi Kitazawa
• p59 Recent Progress in the Understanding of Surface Diffusion: Influence of Phase Transitions and Surface Heterogeneities   [ 1 M ]
  Authors: F. Nieto, A. Tarasenko, C. Uebing
• p97 Some Non-Fickian Diffusion Equations: Theory and Applications   [ 1 M ]
  Authors: Amal K. Das
• p119 Comment on 'Dopant Migration Caused by Point Defect Gradients' [P.Pichler, S. List: Solid State Phenomena, 32-33 (1993) 259]   [ 351 K ]
  Authors: K. Maser