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Articles by author: Hans Cerva

• Chemical Composition and Characterization of the Si/C Interface in Poly-Si Thin Films on Graphite Substrates
  Published in: Polycrystalline Semiconductors IV (p295)
• Defects and Contamination in Microelectronic Device Production: State-of-the-Art and Prospects
  Published in: Ultra Clean Processing of Silicon Surfaces V (p1)
• Defects Below Mask Edges in Silicon Induced by Amorphizing Implantations
  Published in: Defect and Diffusion Forum Vols. 148-149 (p103)
• Identification of Microdefects Induced in Si after Hydrogen and Helium Plasma Treatments
  Published in: Defects in Semiconductors 15 (p1033)
• Influence of Overgrown Micropipes in the Active Area of SiC Schottky Diodes on Long Term Reliability
  Published in: Silicon Carbide and Related Materials 2004 (p925)
• Interaction of Point Defects with Dislocations in Silicon and Germanium: Electrical and Optical Effects
  Published in: Defect Interaction and Clustering in Semiconductors (p67)
• Process-Induced Defects in Silicon Technology
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p231)