HOME
CONTACT
My eBook
Username:
Password:
FULLTEXT SEARCH
NEW:
Advanced Search
MSF
>
Materials Science Forum
KEM
>
Key Engineering Materials
SSP
>
Solid State Phenomena
DDF
>
Defect and Diffusion Forum
AMM
>
Applied Mechanics and Materials
AMR
>
Advanced Materials Research
AST
>
Advances in Science and Technology
JNanoR
>
Journal of Nano Research
JBBTE
>
Journal of Biomimetics, Biomaterials, and Tissue Engineering
JMNM
>
Journal of Metastable and Nanocrystalline Materials
JERA
>
International Journal of Engineering Research in Africa
AEF
>
Advanced Engineering Forum
NH
>
Nano Hybrids
> @scientific.net
CONFERENCE
6/16/2013 - 6/19/2013
The 7th International conference on Physical and Numerical Simulation of Materials Processing
5/16/2013 - 5/19/2013
2nd International Congress on Advanced Materials
4/13/2013 - 4/14/2013
2013 2nd lnternational Conference on lntclligent Materials, Applied Mechanics and Design Science (IMAMD 2013)
more...
Articles by author: Lea Di Cioccio
20 papers on 2 pages:
1
[2]
[next]
4H-SiC Material for Hall Effect and High-Temperature Sensors Working in Harsh Environments
Published in:
Silicon Carbide and Related Materials 2001
(p1435)
Advances in SiC Materials and Technology for Schottky Diode Applications
Published in:
Silicon Carbide and Related Materials 2001
(p1119)
Cubic SiC Surface Structure Studied by X-Ray Diffraction
Published in:
Silicon Carbide and Related Materials - 2002
(p571)
Defect Characterization of Homo-Epitaxially Grown 6H-SiC on (0001) Silicon and (000-1) Carbon Faces
Published in:
Silicon Carbide, III-Nitrides and Related Materials
(p409)
Development of 600 V/ 8 A SiC Schottky Diodes with Epitaxial Edge Termination
Published in:
Silicon Carbide and Related Materials 2001
(p1161)
Electrical and Physical Behavior of SiC Layers on Insulator (SiCOI)
Published in:
Silicon Carbide and Related Materials - 1999
(p715)
Experiment and Modeling of the Large-Area Etching and Growth Rate of Epitaxial SiC
Published in:
Silicon Carbide and Related Materials - 2002
(p141)
Infrared Investigation of Implantation Damage and Implantation Damage Annealing in 4H-SiC
Published in:
Silicon Carbide and Related Materials 2000
(p385)
Intrinsic Mobility of Conduction Electrons in 4H-SiC
Published in:
Silicon Carbide and Related Materials 2000
(p483)
Investigation of Structural Defects during 4H-SiC Schottky Diode Processing by Synchrotron Topography
Published in:
Silicon Carbide and Related Materials 2001
(p419)
Metal Bonding in SiC Based Substrates
Published in:
Silicon Carbide and Related Materials 2004
(p781)
Nitrogen Doping of Epitaxial SiC: Experimental Evidence of the Re-Incorporation of Etched Nitrogen during Growth
Published in:
Silicon Carbide and Related Materials 2003
(p731)
Progress and Limits of the Numerical Simulation of SiC Bulk and Epitaxy Growth Processes
Published in:
Silicon Carbide and Related Materials 2004
(p3)
QuaSiC Smart-Cut
Substrates for SiC High Power Devices
Published in:
Silicon Carbide and Related Materials 2001
(p151)
SiC In-Situ Pre-Growth Etching: A Thermodynamic Study
Published in:
Silicon Carbide and Related Materials - 1999
(p1041)
Username:
Password: