Authors: Florian Speck, Markus Ostler, Jonas Röhrl, Johannes Jobst, Daniel Waldmann, Martin Hundhausen, Lothar Ley, Heiko B. Weber, Thomas Seyller
Abstract: We report on a comprehensive study of the properties of quasi-freestanding monolayer and bilayer graphene produced by conversion of the (6√3×6√3)R30° reconstruction into graphene via intercalation of hydrogen. The conversion is confirmed by photoelectron spectroscopy and Raman spectroscopy. By using infrared absorption spectroscopy we show that the underlying SiC(0001) surface is terminated by hydrogen in the form of Si-H bonds. Using Hall effect measurements we have determined the carrier concentration and type as well as the mobility which lies well above 1000 cm2/Vs despite a significant amount of short range scatterers detected by Raman spectroscopy.
629
Authors: Jonas Röhrl, Martin Hundhausen, Konstantin V. Emtsev, Thomas Seyller, Lothar Ley
Abstract: We present a micro-Raman spectroscopy study on single- and few layer graphene (FLG)
grown on the silicon terminated surface of 6H-silicon carbide (SiC). On the basis of the 2D-line (light
scattering from two phonons close to the K-point in the Brillouin zone) we distinguish graphene
mono- from bilayers or few layer graphene. Monolayers have a 2D-line consisting of only one
component, whereas more than one component is observed for thicker graphene layers. Compared to
the graphite the monolayer graphene lines are shifted to higher frequencies. We tentatively ascribe the
corresponding phonon hardening to strain in the first graphene layer.
567
Authors: Thomas Seyller, Konstantin V. Emtsev, Florian Speck, Kun Yuan Gao, Lothar Ley
Abstract: We have studied the electronic structure of the interface between 6H-SiC{0001} and
graphite. On n-type and p-type 6H-SiC(0001) we observe Schottky barriers of ÁSi
b,n = 0.3±0.1
eV and ÁSi
b,p = 2.7±0.1 eV, respectively. The observed barrier is face specific: on n-type 6H-
SiC(0001) we find ÁC
b,n = 1.3±0.1 eV. The impact of these barriers on the electrical properties
of metal/SiC contacts is discussed.
701
Authors: Konstantin V. Emtsev, Thomas Seyller, Florian Speck, Lothar Ley, P. Stojanov, J.D. Riley, R.C.G. Leckey
Abstract: Graphitization of the 6H-SiC(0001) surface as a function of annealing temperature has
been studied by ARPES, high resolution XPS, and LEED. For the initial stage of graphitization –
the 6√3 reconstructed surface – we observe σ-bands characteristic of graphitic sp2-bonded carbon.
The π-bands are modified by the interaction with the substrate. C1s core level spectra indicate that
this layer consists of two inequivalent types of carbon atoms. The next layer of graphite (graphene)
formed on top of the 6√3 surface at TA=1250°C-1300°C has an unperturbed electronic structure.
Annealing at higher temperatures results in the formation of a multilayer graphite film. It is shown
that the atomic arrangement of the interface between graphite and the SiC(0001) surface is
practically identical to that of the 6√3 reconstructed layer.
525
Authors: Roland Püsche, Martin Hundhausen, Lothar Ley, Kurt Semmelroth, Gerhard Pensl, Patrick Desperrier, Peter J. Wellmann, Eugene E. Haller, J.W. Ager, Ulrich Starke
Abstract: We study electronic Raman scattering of phosphorus and nitrogen doped silicon
carbide (SiC) as a function of temperature in the range 7K < T < 300K. We observe a
series of peaks in the Raman spectra which we assign to electronic transitions at nitrogen
and phosphorus donors on different lattice sites. These transitions are identified as valley orbit
transitions of the 1s donor ground state. From the polarization dependence of the observed
peaks, we find that all electronic Raman signals have E2-symmetry of C6v for the hexagonal
polytypes (6H-SiC and 4H-SiC) and E-symmetry of C3v for 15R-SiC. We find a reduction of
the intensities of all valley-orbit Raman signals with increasing temperature and ascribe this
reduction to the decreasing occupation of donor states.
579
Authors: Jürgen Ristein, Paul Strobel, Lothar Ley
Abstract: One of the most amazing features of diamond is the p-type surface conductivity which
occurs when intrinsic material is hydrogen terminated and brought into contact with appropriately
chosen adsorbates. Experiments during the last decade have revealed the different roles of the
surface acceptors and of the covalent carbon-hydrogen surface bonds: providing unoccupied
electronic states, and lowering the energy barrier for electron transfer from the diamond,
respectively. The simplest and historically first method to supply surface acceptors, i.e. exposing
hydrogenated diamond to air, provides, unfortunately, the most complex electronic system acting as
surface acceptors, namely solvated ions within atmospheric wetting layers. In that case electron
transfer is accompanied by a red-ox reaction that finally induces the hole accumulation.
A much simpler case of transfer doping has been demonstrated for C60F48 as molecular surface
accpeptors. In this case, the doping yield as a function of surface coverage can be modelled
quantitatively by the transfer doping mechanism. Also, pure C60 can be adopted for transfer doping,
but the formation of the van-der-Waals solid is required in this case to circumvent the electron
correlation energy for charge transfer to a single fullere cage. The C60 layers can be stabilized by
oxygen-mediated polymerisation without loosing their doping efficiency.
93
Authors: Kun Yuan Gao, Thomas Seyller, Konstantin V. Emtsev, Lothar Ley, Florin Ciobanu, Gerhard Pensl
Abstract: Atomic Layer Deposited Al2O3 films on hydrogen-terminated 6H-SiC(0001) were
annealed in hydrogen atmosphere and characterized by admittance spectroscopy measurement and photoelectron spectroscopy (PES). The resultant density of interface trap (Dit) from admittance spectroscopy measurement is reduced near mid gap, but increases strongly towards the conduction band edge. Systematic PES measurements show that hydrogen annealing introduces Si4+ as a new component besides Si0 and Si+. Using different electron escape depths for photon electrons, depth profiling of Si in its different oxidation states was performed. The result indicates the formation of a top SiO2 layer and a rougher interfacial layer containing more Si+ and Si4+ which could be responsible for the strong increase of Dit just below the conduction band edge.
559
Authors: Konstantin V. Emtsev, Thomas Seyller, Lothar Ley, A. Tadich, L. Broekman, E. Huwald, J.D. Riley, R.C.G. Leckey
Abstract: We have investigated Si-rich reconstructions of 4H-SiC( 00 1 1 ) surfaces by means of low-energy electron diffraction (LEED), x-ray photoelectron spectroscopy (XPS), and angleresolved ultraviolet photoelectron spectroscopy (ARUPS). The reconstructions of 4H-SiC( 00 1 1 ) were prepared by annealing the sample at different temperatures in a flux of Si. Depending on the
temperature different reconstructions were observed: c(2×2) at T=800°C, c(2×4) at T=840°C. Both reconstructions show strong similarities in the electronic structure.
547
Authors: Thomas Seyller, Konstantin V. Emtsev, R. Graupner, Lothar Ley
1317
Authors: Thomas Seyller, Kun Yuan Gao, Lothar Ley, Gerhard Pensl, Florin Ciobanu, A. Tadich, J.D. Riley, R.C.G. Leckey
1369