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Articles by author: Mats Kleverman

• Carbon-Oxygen-Related Complexes in Irradiated and Heat-Treated Silicon: IR Absorption Studies
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p57)
• Defect Spectroscopy in Compound Semiconductors
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p195)
• Effective-Mass Theory of Shallow Donors in 4H-SiC
  Published in: Silicon Carbide and Related Materials 2004 (p511)
• Excitation Spectrum of the Interstitial Iron Donor in Silicon
  Published in: Defects in Semiconductors 15 (p397)
• Formation of Ultra Shallow Donors in Silicon by Long-Term-Annealing at 470 °C
  Published in: Defects in Semiconductors 19 (p385)
• Identification of the Iron-Boron Line Spectrum in Silicon
  Published in: Defects in Semiconductors 17 (p171)
• Identification of the Si:Au and Si:Pt 1S_3/2(Г₈)+Г Phonon-Assisted Fano Resonance
  Published in: Defects in Semiconductors 19 (p479)
• Oxygen and Carbon Clustering in Cz-Si during Electron Irradiation at Elevated Temperatures
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p297)
• Photothermal Ionization Spectroscopy
  Published in: Defects in Semiconductors 15 (p341)
• Photo-Thermal Ionization Spectroscopy of Point Defects in Semiconductors
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p277)
• Pseudo or Deep Donor Excitation Spectra in Silicon
  Published in: Defects in Semiconductors 19 (p497)
• Spectroscopy on Transition-Metal Defects in Silicon
  Published in: Defects in Semiconductors 16 (p125)
• Stable Hydrogen Pair Trapped at Carbon Impurities in Silicon
  Published in: Defects and Diffusion in Semiconductors (p1)
• The Excited ⁵T₁ State of the Fe_i^o -Center in Silicon
  Published in: Defects in Semiconductors 17 (p165)
• The Gold Center in Silicon
  Published in: Defects in Semiconductors 16 (p215)