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Articles by author: Teimuraz Mchedlidze

• Characterization of Thin Film Photovoltaic Material Using Photoluminescence and Raman Spectroscopy
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p419)
• Determination of the Origin of Dislocation Related Luminescence from Silicon Using Regular Dislocation Networks
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p567)
• Dislocations in Silicon as a Tool to Be Used in Optics, Electronics and Biology
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p289)
• Electrical Transport in Si_xGe_1-x Bulk Alloys
  Published in: Defects in Semiconductors 18 (p353)
• Electronic States of Oxygen-Free Dislocation Networks Produced by Direct Bonding of Silicon Wafers
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p283)
• Engineering of Dislocation-Loops for Light Emission from Silicon Diodes
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p303)
• Formation and Properties of Iron-Phosphorus and Iron-Phosphorus-Hydrogen Complexes in Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p379)
• Gate-Oxide Integrity Evaluation Using Non-Ideal Metal-Oxide-Silicon Capacitor Structures
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p735)
• I. Conductivity Along Dislocations: Temperature Dependence and Nonlinear Effects II. Combined Resonance and Structure Peculiarities of Plastically Deformed Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p301)
• Optimization of the Luminescence Properties of Silicon Diodes Produced by Implantation and Annealing
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p579)
• Oxygen Precipitation in CZ Silicon Crystals Contaminated with Iron
  Published in: Defects in Semiconductors 18 (p1859)
• Regular Dislocation Networks in Si. Part II: Luminescence
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p503)
• Regular Dislocation Networks in Silicon. Part I: Structure
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p571)
• Subsurface Damage in Single Diamond Tool Machined SI Wafers
  Published in: Defects in Semiconductors 18 (p1841)