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CONFERENCE
6/16/2013 - 6/19/2013
The 7th International conference on Physical and Numerical Simulation of Materials Processing
5/16/2013 - 5/19/2013
2nd International Congress on Advanced Materials
4/13/2013 - 4/14/2013
2013 2nd lnternational Conference on lntclligent Materials, Applied Mechanics and Design Science (IMAMD 2013)
more...
Articles by author: Wook Bahng
33 papers on 3 pages:
1
[2]
[3]
[next]
4H-SiC p-n Diode using Internal Ring (IR) Termination Technique
Published in:
Silicon Carbide and Related Materials 2003
(p1041)
Breakdown Voltage Characteristics of FLR-Assisted SiC-SBD Formed by Aluminum Metal Junction Edge Termination
Published in:
Silicon Carbide and Related Materials 2006
(p861)
Characteristics of Post-Nitridation Rapid-Thermal Annealed Gate Oxide Grown on 4H-SiC
Published in:
Silicon Carbide and Related Materials 2004
(p689)
Co-Formation of Gate Electrode and Ohmic Contacts in SiC Power MOSFETs
Published in:
Silicon Carbide and Related Materials - 2002
(p661)
Damage Relaxation Pre-Activation Anneal in Al-Implanted SiC
Published in:
Silicon Carbide and Related Materials - 2002
(p617)
Design and Characterization of 50W Switch Mode Power Supply Using Normally-On SiC JFET
Published in:
Silicon Carbide and Related Materials 2009
(p1151)
Die Bonding Issues on Silicon Carbide Diodes
Published in:
Silicon Carbide and Related Materials 2005
(p875)
Edge Termination Technique for SiC Power Devices
Published in:
Silicon Carbide and Related Materials 2003
(p1241)
Effect of Post-Oxidation Annealing on High-Temperature Grown SiO
2
/4H-SiC Interface
Published in:
Silicon Carbide and Related Materials 2007
(p731)
Effect of the Doping Concentration and Space of Both p-Grid and Field Limiting Ring on 4H-SiC Junction Barrier Schottky Diode with Single Ion Implantation Process
Published in:
Silicon Carbide and Related Materials 2007
(p959)
Effects of Substrate Temperature on the Electrical and the Optical Properties of N-Type ZnO/P-Type 4H-SiC
Published in:
Silicon Carbide and Related Materials 2011
(p1327)
Electrical Properties of Atomic-Layer-Deposited La
2
O
3
/Thermal-Nitrided SiO
2
Stacking Dielectric on 4H-SiC(0001)
Published in:
Silicon Carbide and Related Materials 2006
(p643)
Electrical Properties of Metal-Oxide-Semiconductor (MOS) Structures on 4H-SiC(0001) Formed by Oxidizing Pre-Deposited Si
x
N
y
Published in:
Silicon Carbide and Related Materials 2006
(p647)
Enlargement of SiC Single Crystal: Enhancement of Lateral Growth using Tapered Graphite Lid
Published in:
Silicon Carbide and Related Materials - 1999
(p103)
Fabrication and Characterization of 4H-SiC pn Diode with Field Limiting Ring
Published in:
Silicon Carbide and Related Materials 2003
(p1013)
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