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Articles by keyword: «Depth-Profiling»

• A Novel Processing Method for the Microstructural Design of Functionally-Graded Ceramic Composites
  Published in: High-Performance Ceramics 2001 (p465)
• A Quantitative Method of Metal Impurities Depth Profiling for Gettering Evaluation in Silicon Wafers
  Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p81)
• Auger Depth Profiling with Good Depth Resolution of Low Energy Implantation Induced Ion Mixing
  Published in: Materials Science Applications of Ion Beam Techniques (p245)
• Cathodoluminescence Depth Profiling of Ge-Implanted SiO₂ Layers
  Published in: Beam Injection Assessment of Microstructures in Semiconductors (p119)
• Characterisation of Graded Coatings Using GD-OES
  Published in: Functionally Graded Materials (p879)
• Corrosion Depth Profiles by Rutherford Backscattering Spectrometry and Synchrotron X-Ray Reflrectometry
  Published in: Materials Science Applications of Ion Beam Techniques (p365)
• Depth Profiling of Defects in Argon Irradiated Silicon Using Positron Beam Facility at Kalpakkam
  Published in: Positron Annihilation - ICPA-11 (p650)
• Limits of Ion-Beam Depth-Profiling as Used in Diffusion Studies of Oxidation-Sensitive Materials
  Published in: Defects and Diffusion in Metals (p147)
• Neutron Diffraction Residual Stress Measurement at NIST
  Published in: Nondestructive Characterization of Materials VII (p155)
• On the Use of SNMS for the Manufacture Control of Ag Colloid Containing Sol-Gel Fillms on Glass
  Published in: Trends and New Applications of Thin Films (p407)
• Sims Characterization of Noble Metal-Based Thin Film Electrodes
  Published in: Synthesis and Properties of Mechanically Alloyed and Nanocrystalline Materials (p625)
• Structural and Morphological Characterization of Al/Ti-Based Ohmic Contacts on p-Type 4H-SiC Annealed Under Various Conditions
  Published in: Silicon Carbide and Related Materials - 1999 (p1017)