Papers by Keyword: Depth-Profiling

Paper TitlePage

A Novel Processing Method for the Microstructural Design of Functionally-Graded Ceramic Composites
Authors: It Meng Low, P. Manurung, R.I. Smith, D. Lawrence
465
Limits of Ion-Beam Depth-Profiling as Used in Diffusion Studies of Oxidation-Sensitive Materials
Authors: H. Ehmler, A. Rehmet, Klaus Rätzke, Franz Faupel
147
Cathodoluminescence Depth Profiling of Ge-Implanted SiO2 Layers
Authors: Hans Joachim Fitting, T. Barfels, Bernd Schmidt, A. von Czarnowski
119
Structural and Morphological Characterization of Al/Ti-Based Ohmic Contacts on p-Type 4H-SiC Annealed Under Various Conditions
Authors: Konstantin Vassilevski, Konstantinos Zekentes, George Konstantinidis, N. Papanicolaou, Irina P. Nikitina, A.I. Babanin
1017
Characterisation of Graded Coatings Using GD-OES
Authors: D. Delfosse
879
On the Use of SNMS for the Manufacture Control of Ag Colloid Containing Sol-Gel Fillms on Glass
Authors: W. Bock, B. Kutsch, M. Kopnarski, H. Oechsner
407
Depth Profiling of Defects in Argon Irradiated Silicon Using Positron Beam Facility at Kalpakkam
Authors: G. Amarendra, G. Venugopal Rao, K.G.M. Nair, B. Viswanathan
650
A Quantitative Method of Metal Impurities Depth Profiling for Gettering Evaluation in Silicon Wafers
Authors: Mohammad B. Shabani, T. Yoshimi, S. Okuuchi, A. Kaniava
81
Corrosion Depth Profiles by Rutherford Backscattering Spectrometry and Synchrotron X-Ray Reflrectometry
Authors: E. Szilágyi, L. Bottyán, L. Deák, E. Gerdau, V.N. Gittsovich, A. Gróf, E. Kótai, O. Leupold, D.L. Nagy, V.G. Semenov
365
Auger Depth Profiling with Good Depth Resolution of Low Energy Implantation Induced Ion Mixing
Authors: A. Sulyok, A. Galisova, M. Menyhard
245
Showing 1 to 10 of 12 Paper Titles