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Articles by keyword: «Electron Beam Induced Current (EBIC)»

• Investigation of Minority Carrier Diffusion Length in Multicrystalline Silicon by Quantitative Electron Beam Induced Current Mapping
  Published in: Polycrystalline Semiconductors III (p189)
• Investigation of the Defect Distribution in Polycrystalline Silicon
  Published in: Polycrystalline Semiconductors III (p243)
• Local Grain Boundary Property Measurements
  Published in: Polycrystalline Semiconductors III (p171)
• Microcharacterization of Polycrystalline Semiconductors by Scanning Electron Microscopy in Electron Beam Induced Current Mode
  Published in: Polycrystalline Semiconductors IV (p39)
• Oxygen and Copper Precipitation in the Vicinity of the Silicon-Silicon-Dioxide Interface: Microstructure and Electrical Properties
  Published in: Polycrystalline Semiconductors III (p133)
• Progress in Cold-Wall Epitaxy for 4H-SiC High-Power Devices
  Published in: Silicon Carbide and Related Materials 2006 (p141)
• Qualitative and Quantitative Analysis of Thin Film Heterostructures by Electron Beam Induced Current
  Published in: Polycrystalline Semiconductors V (p57)
• Reconstruction of Diffusion Length Distribution by the Modulated EBIC and OBIC
  Published in: Beam Injection Assessment of Microstructures in Semiconductors (p79)
• Simulation of EBIC Contrast for Extended Defects Inclined to the Surface
  Published in: Beam Injection Assessment of Microstructures in Semiconductors (p73)
• The Electrical Activity of Dislocations in Edge-Defined Film-Fed Growth Silicon
  Published in: Polycrystalline Semiconductors III (p3)