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Articles by keyword: «Helium Implantation»

• Anti-Site Defects are Found at Large Distances from Localised H and He Ion Implantations
  Published in: Silicon Carbide and Related Materials 2008 (p409)
• Behaviour of Helium in Iron and Dilute Iron-Titanium Alloy
  Published in: Positron Annihilation - ICPA-10 (p489)
• Cavity Formation in Helium-Implanted Silicon - Temperature Dependence
  Published in: Defects and Diffusion in Semiconductors (p37)
• Creep Rupture Properties of Helium Implanted Low Activation Martensitic Steel for Nuclear Fusion Application
  Published in: Creep and Fracture of Engineering Materials and Structures (p115)
• Dopant Segregation on Cavities Induced by Helium Implantation: Impact of the Doping Level
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p599)
• Dopant Segregation on Cavities Induced by Helium Implantation: The Case of Boron and Phosphorus
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p309)
• Doping Effect of Helium Induced Nanocavities in Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p325)
• Effect of Thermal Vacancies on Anomalous Helium Bubble Growth in Palladium: A Positron Annihilation Study
  Published in: Positron Annihilation - ICPA-11 (p578)
• Evolution of Defect Profiles in He-Implanted Silicon Studied by Slow Positrons
  Published in: Positron Annihilation - ICPA-11 (p665)
• Gettering Induced by Helium Implantation: Application to a Device
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p279)
• Influence of Grain Boundary Structure on Bubble Formation Behaviour in Helium Implanted Copper
  Published in: Intergranular and Interphase Boundaries in Materials (p445)
• Properties of Cavities Induced by Helium Implantation in Silicon and their Applications to Devices
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p297)
• Simon-Glatzel Transformation of Overpressurised Helium Bubbles in Aluminium Seen by Positrons
  Published in: Positron Annihilation - ICPA-12 (p97)