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Articles by keyword: «Metal Impurity»

• A Long-Term Reliability of Thermal Oxides Grown on n-Type 4H-SiC Wafer
  Published in: Silicon Carbide and Related Materials 2003 (p1269)
• An Electron Paramagnetic Resonance Study of Defects in Semiconducting Iron Disilicide
  Published in: Defects in Semiconductors 18 (p389)
• Cu Determination in Silicon Wafers: A Comparison between Electrical and Chemical Measurements
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p461)
• Gettering by Voids in Silicon: A Comparison with other Techniques
  Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p43)
• Gettering in Advanced Low Temperature Processes
  Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p53)
• Impurity-Defect Complexes in Neutron Transmutation Doped Gallium Arsenide and Germanium Crystals
  Published in: Defects in Semiconductors 18 (p1413)
• Oxygen Precipitation Behaviour and Internal Gettering in Epitaxial and Polished Czochralski Silicon Wafers
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p63)
• Spatially Resolved Defect Analysis in Cz-Silicon after Copper-Nickel Co-Precipitation by Virtue of Light-Beam-Induced Current Measurements
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p431)
• X-Ray Characterization of Ag Impurities in Na_1-xAg_xCl
  Published in: Defects and Diffusion in Metals (p33)