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Articles by keyword: «SIMOX»

• A Quantitative Method of Metal Impurities Depth Profiling for Gettering Evaluation in Silicon Wafers
  Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p81)
• Carbonization of SIMOX Substrates for Fabrication of Single-crystal SiC-on-insulator
  Published in: Silicon Carbide and Related Materials - 1999 (p297)
• Characterization of SiGe Layer on Insulator by In-Plane Diffraction Method
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p451)
• Combined MOS/EBIC and Tem Study of Electrically Active Defects in SOI Wafers
  Published in: Beam Injection Assessment of Defects in Semiconductors (p61)
• Existence of an Epitaxially Ordered Phase in the Buried Oxide of SIMOX Wafers
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p485)
• Hybrid Simulations for Desinging of Nano-Interfacial Structures
  Published in: Designing of Interfacial Structures in Advanced Materials and their Joints (p57)
• Native and Irradiation-Induced Defects in SiO₂ Structures Studied by Positron Annihilation Techniques
  Published in: Positron Annihilation - ICPA-12 (p64)
• Photoluminescence Study on Point Defects in SIMOX Buried SiO₂ Film
  Published in: Defects in Semiconductors 18 (p1909)
• Transmission Electron Microscopy Study of GaN on SiC on SIMOX Grown by Metalorganic Chemical Vapor Deposition
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p1239)