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Articles by keyword: «Si_1-xGe_x»

• Antimony Diffusion in Strained and Relaxed Si_1-xGe_x
  Published in: Diffusion in Materials DIMAT 1996 (p1131)
• Combining RBS and FTIR Spectroscopy for the Ge Analysis in Si_1-xGe_x Single Crystals
  Published in: Materials Science Applications of Ion Beam Techniques (p377)
• Comparative Analysis of Light Emitting Properties of Si: Er and Ge/Si_1-xGe_x Epitaxial Structures Obtained by MBE Method
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p377)
• Composition Analysis of Ge/Si_1-xGe_x: C Buffer on Silicon Measured by Planar Scanning Energy Dispersive Spectroscopy
  Published in: Manufacturing Science and Technology (p7619)
• Dopant Diffusion in Strained and Relaxed Si_1-xGe_x
  Published in: Defects in Semiconductors 18 (p345)
• Dry Oxidation Behavior of Epitaxial Si_0.7Ge_0.3 Films
  Published in: Designing, Processing and Properties of Advanced Engineering Materials (p361)
• In Situ Phosphorus Doping of Si and Si_1-xGe_x Epitaxial Layers by RTP/VLP-CVD
  Published in: Defects in Semiconductors 18 (p349)
• On the Properties of Divacancies in Si_1-xGe_x
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p545)
• Ordering in Semiconductor Alloys
  Published in: Reactive Phase Formation at Interfaces and Diffusion Processes (p131)
• Substitutional Carbon in Ge and Si_1-xGe_x.
  Published in: Defects in Semiconductors 19 (p97)