Determining of Infrared Transition of InN Film Grown on C-Plane Sapphire by Photoreflectance

Abstract:

An InN film was grown on sapphire (c-plane) by plasma-assisted molecular beam epitaxy, and its photoluminescence at 10 K and photoreflectance (PR) spectra from 10 K to 110 K were measured. Some prominent features in the PR spectra were observed in the infrared region below 120 K. The signals become too weak to observable for temperature above 110K. Furthermore, the binding energy of InN exciton was estimated to be 9.43 meV, which is equal to kBT at 109K. Therefore, the features in the PR spectra were assigned to the A, B, and C excitonic transitions associated with the direct gap of wurtzite InN. The thus obtained energies of the A, B, and C excitonic transitions versus temperature were fitted well by Varshini’s equation. The energies of the A, B, and C excitonic transitions at room temperature obtained by the best fit of Varshni’s equation are 0.738, 0.746, and 0.764 eV, respectively.

• Periodical: Applied Mechanics and Materials (Volumes 110-116)
• Pages: 985-990
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.110-116.985
• Online since: October 2011
• Authors: Dong Po Wang, Li Wei Tu
• Keywords: Exciton, InN, Photoreflectanc

References

[1] A. G. Bhuiyan, A. Hashimoto, and A. Yamamoto, J. appl. Phys. 94 2779 (2003), and references therein.

[2] S. Gwo, C. -L. Wu, C. -H. Shen, W. -H. Chang, T. M. Hsu, J. -S. Wang, and J. -T. Hsu, Appl. Phys. Lett. Vol. 84, 2004, p.3765.

[3] V. Yu. Davydov, A. A. Klochikhin, R. P. Seisyan, V. V. Emtsev, S. V. Ivanov, F. Bechstedt, J. Furthmüller, H. Harima, A. V. Mudryi, J. Aderhold, O. Semchinova, and J. Graul, Phys. Status Solidi vol. B 229, 2002, pp. R1.

DOI: 10.1002/1521-3951(200202)229:3<r1::aid-pssb99991>3.0.co;2-o

[4] V. Yu. Davydov, A. A. Klochikhin, V. V. Emtsev, D. A. Kurdyukov, S. V. Ivanov, F. Bechstedt, J. Furthmüller, J. Aderhold, J. Graul, A. V. Mudryi, H. Harima, A. Hashimoto, A. Yamamoto, and E. E. Haller, Phys. Status Solidi vol. B 234, 2002, p.787.

DOI: 10.1002/1521-3951(200212)234:3<787::aid-pssb787>3.0.co;2-h

[5] J. Wu, W. Walukiewicz, K. M. Yu, J. W. Ager III, E. E. Haller, H. Lu, W. J. Schaff, Y. Saito, and Y. Nanishi, Appl. Phys. Lett. vol. 80, 2002, p.3967.

DOI: 10.1063/1.1482786

[6] J. Wu, W. Walukiewicz, W. shan, K. M. Yu, J. W. Ager III, S. X. Li, E. E. Haller, H. Lu, and W. J. Schaff, Appl. Phys. Lett. vol. 94, 2003, p.4457.

[7] T. Matsuoka, H. Okamoto, M. Nakao, H. Harima, and E. Kurimoto, Appl. Phys. Lett. Vol. 81, 2002, p.1246.

[8] K. Xu, and A. Yoshikawa, Appl. Phys. Lett. vol. 83, 2003, p.251.

[9] T. L. Tansley and C. P. Foley, J. Appl. Phys. vol. 59, 1986, p.3241.

[10] Q. Guo and A. Yoshida, Jpn. J. Appl. Phys., Part 1 vol. 33, 1994, p.2453.

[11] T. Yodo, H. Yona, H. Ando, D. Nosei, and Y. Harada, Appl. Phys. Lett. 80, 968, (2002).

[12] L. W. Tu, C. L. Hsiao, T. W. Chi, I. Lo, and K. Y. Hsieh, Appl. Phys. Lett. vol. 82, 2003, p.1601.

[13] See, for example, R. N. Bhattacharya, H. Shen, P. Parayanthal, and F. H. Pollak, Phys. Rev. vol. B 37, 1988, p.4044.

[14] D. E. Aspnes, in Optical properties of Solids, edited by M. Balkanski, North-Holland, Amsterdam, 1980, Chap. 4A.

[15] F. H. Pollak and O. J. Glembocki, SPIE Proc. Vol. 946, 1988, p.2.

[16] V. Yu. Davydov et al., Appl. Phys. Lett. vol. 75, 1999, p.3297.

[17] Fabio Bernardini and Vincenzo Fiorentini, Phys. Rev. vol. B 58, 1998, p.15292.

[18] S. P. Fu and Y. F. Chen, Appl. Phys. Lett. vol. 85, 2004, p.9.