Ionizing Radiation Testing System for Emerging Semiconductor Materials and Devices

Abstract:

Article Preview

A technical design and implementation method of a ionizing radiation testing system, which is especially applicable to conduct experiments of studying X-ray and γ-ray radiation effects in emerging semiconductor materials and devices, has been demonstrated by connecting components of a PC, a KEITHLEY 487, a HP 8110A, an Agilent 4284A, and a probe station together. The lead thickness of the lead shielding cylinder container is obtained numerically at least 2.1cm for safely holding a 1 GBq Cs137 γ-ray source.

Info:

Periodical:

Edited by:

Jiuba Wen, Fuxiao Chen, Ye Han and Huixuan Zhang

Pages:

495-498

DOI:

10.4028/www.scientific.net/AMM.120.495

Citation:

X. L. Hu et al., "Ionizing Radiation Testing System for Emerging Semiconductor Materials and Devices", Applied Mechanics and Materials, Vol. 120, pp. 495-498, 2012

Online since:

October 2011

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Price:

$35.00

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