Ionizing Radiation Testing System for Emerging Semiconductor Materials and Devices

Abstract:

A technical design and implementation method of a ionizing radiation testing system, which is especially applicable to conduct experiments of studying X-ray and γ-ray radiation effects in emerging semiconductor materials and devices, has been demonstrated by connecting components of a PC, a KEITHLEY 487, a HP 8110A, an Agilent 4284A, and a probe station together. The lead thickness of the lead shielding cylinder container is obtained numerically at least 2.1cm for safely holding a 1 GBq Cs¹³⁷ γ-ray source.

• Periodical: Applied Mechanics and Materials (Volume 120)
• Pages: 495-498
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.120.495
• Online since: October 2011
• Authors: Xin Li Hu, Jing Kang Gui, Ce Zhou Zhao
• Keywords: Ionizing Radiation, Probe Station, Radiation Shielding, Testing System, X-Ray

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