Ionizing Radiation Testing System for Emerging Semiconductor Materials and Devices
A technical design and implementation method of a ionizing radiation testing system, which is especially applicable to conduct experiments of studying X-ray and γ-ray radiation effects in emerging semiconductor materials and devices, has been demonstrated by connecting components of a PC, a KEITHLEY 487, a HP 8110A, an Agilent 4284A, and a probe station together. The lead thickness of the lead shielding cylinder container is obtained numerically at least 2.1cm for safely holding a 1 GBq Cs137 γ-ray source.
Jiuba Wen, Fuxiao Chen, Ye Han and Huixuan Zhang
X. L. Hu et al., "Ionizing Radiation Testing System for Emerging Semiconductor Materials and Devices", Applied Mechanics and Materials, Vol. 120, pp. 495-498, 2012