Image-Based Inspection System for Detection of Glass Substrate’s Edge Defects

Abstract:

Large size TFT-LCD (Thin-Film Transistor Liquid-Crystal Display, which is commonly called as panel) is made after lots of processes and is cut based on the required size in the last process. Deckle-edge (Burr) and other defects were produced by cutting. Therefore, it needs to examine the products’ defects before grinding the edges or the following processes. This research developed a new type and high-efficiency apparatus for panel-edge inspection. The defects are sorted based on three types “Fractures, Cracks and Dark-spots” by using image-subtraction, binary thresholding, and blob-analysis methods. The proposed system can improve the efficiency on panel-edge inspection for panel manufacturers. The production of flat panel-edge inspection can be increased to over 40% which can resolve the bottleneck processes for panel industry.

• Periodical: Applied Mechanics and Materials (Volumes 121-126)
• Pages: 3970-3976
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.121-126.3970
• Online since: October 2011
• Authors: Quang Cherng Hsu, Chi Ming Lin
• Keywords: Automatic Optic Inspection, Defect Detection, Glass, Image Processing

References

[1] Q.C. Hsu and C.M. Lin, Patent analysis on AOI system of glass substrate in domestic industry, Precision Manufacturing Conference, Society of Manufacturing Engineering – Taipei Chapter, National Kaohsiung University of Applied Sciences (in Chinese), 2007.

[2] N. Otsu, A Threshold Selection Method From Gray Level Histograms, IEEE Transactions on Systems, Man, and Cybernetics, pp.62-66, 1979.

DOI: 10.1109/tsmc.1979.4310076

[3] Q. Chen, A double-threshold image binarization method based on edge detector, Pattern Recognition, Vol. 41, pp.1254-1267, 2007.

DOI: 10.1016/j.patcog.2007.09.007

[4] D.T. Lee, A computerized automatic inspection system for complex printed thick film patterns, SPIE-Appl. Election. Imageing Syst., Vol. 143, pp.172-177, 1978.

[5] W.Y. Wu, Automated inspection of printed circuit boards through machine vision, Computer in Industry, Vol. 28, pp.103-111, 1996.

DOI: 10.1016/0166-3615(95)00063-1

[6] Anon. Matrox Imaging Library Ver. 8 - User Guide, Matrox Electronic System Ltd., Canada, 2005.

[7] Y. Wang, Principles and applications of structural image matching, Journal of Photogrammetry & Remote Sensing, Vol. 53, pp.154-165, (1998)

DOI: 10.1016/s0924-2716(98)00002-1

[8] Y.T. Liu, Development on BGA IC outlook inspection system and transfer mechanism, Master thesis of National Pingtung University of Science and Technology, Department of Mechanical Engineering (in Chinese), 2004.