Research on the Properties of NiZnO Thin Films

Abstract:

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NiZnO thin films had been fabricated on c-plane sapphire substrates using photo-assisted metal organic chemical vapour deposition system. The crystal quality of the films had been improved greatly comparing to the results in earlier reports. The crystal structure analysis indicated the NiZnO kept the basic wurtzite structure until the content of Ni attained 0.18. The crystal and electrical properties of the films showed the content of Ni had an important effect on the properties of NiZnO films.

Info:

Periodical:

Edited by:

Han Zhao

Pages:

1491-1494

DOI:

10.4028/www.scientific.net/AMM.130-134.1491

Citation:

X. Dong et al., "Research on the Properties of NiZnO Thin Films", Applied Mechanics and Materials, Vols. 130-134, pp. 1491-1494, 2012

Online since:

October 2011

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Price:

$35.00

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