Study of Sampling in CCD Photoelectric Imaging System

Nao Sheng Qiao; Chun Mei Yao

doi:10.4028/www.scientific.net/AMM.220-223.2087

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 220-223Study of Sampling in CCD Photoelectric Imaging...

Study of Sampling in CCD Photoelectric Imaging System

Abstract:

Aiming at the importance of sampling in CCD photoelectric imaging system, the content is studied by us in detail. Firstly, its basic principle is analyzed, and the simple physics explanation and formula deduction are given, and the spectrum expression is obtained. Secondly, the cause of lack sampling is analysed. Finally, the results of experiment verify the correctness of theory analysis.