ICP-AES Determination of the Four Trace Elements (Al, Ca, P, Ti) in the Ferrosilicon

Yan Fang Wu; Ya Juan Jia; Huan Huan He; Pu Liu

doi:10.4028/www.scientific.net/AMM.273.473

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vol. 273ICP-AES Determination of the Four Trace Elements...

ICP-AES Determination of the Four Trace Elements (Al, Ca, P, Ti) in the Ferrosilicon

Abstract:

Ferrosilicon by swinging open vessel acid decomposition method after acid decomposition processing, based on national standards GB/T24194-2009, using inductively coupled plasma atomic emission spectrometry (ICP-AES), determination of the four trace elements (Al, Ca, P, Ti) content in ferrosilicon sample, The use of modern instruments with background correction technology to eliminate polyatomic ion interference on the part of the measured elements. The results of the various elements of the recoveries were between 98.994% and 103.01%, all the precision (RSD) of the detected value is less than 3%, so the high technical accuracy, able to meet the requirements of the simultaneous determination of a variety of elements in ferrosilicon samples.

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Periodical:

Applied Mechanics and Materials (Volume 273)

Pages:

473-477

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.273.473

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Online since:

January 2013

Authors:

Yan Fang Wu, Ya Juan Jia, Huan Huan He, Pu Liu

Keywords:

Ferrosilicon Sample, ICP-AES, Recoveries, Trace Elements (Al, Ca, P, Ti)

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