TEM Study of FePt and FePt:C/FePt Composite Double-Layered Thin Films

Ling Fang Jin; Xing Zhong Li

doi:10.4028/www.scientific.net/AMM.275-277.1952

Paper Titles

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Investigation on the Optical Performance of Co and Al Co-Doping ZnO Films
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Properties of N-Doped ZnO Films by RF Magnetron Sputtering
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TEM Study of FePt and FePt:C/FePt Composite Double-Layered Thin Films
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Synthesis and Characterization of CdTe Quantum Dots Capped by N-Acetyl-L-Cysteine
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The Influence of Electrochemical Anodization for Porous Silicon Microcavity Fabrication
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Research on Accumulation PMOS Capacitors Based on Strained-Si/SiGe Material
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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 275-277TEM Study of FePt and FePt:C/FePt Composite...

TEM Study of FePt and FePt:C/FePt Composite Double-Layered Thin Films

Abstract:

New functional nanocomposite FePt:C thin films with FePt underlayers were synthesized by noneptaxial growth. The effect of the FePt layer on the ordering, orientation and magnetic properties of the composite layer has been investigated by adjusting FePt underlayer thickness from 2 nm to 14 nm. Transmission electron microscopy (TEM), together with x-ray diffraction (XRD), has been used to check the growth of the double-layered films and to study the microstructure, including the grain size, shape, orientation and distribution. XRD scans reveal that the orientation of the films was dependent on FePt underlayer thickness. In this paper, the TEM studies of both single-layered nonepitaxially grown FePt and FePt:C composite L10 phase and double-layered deposition FePt:C/FePt are presented.