Application of Interferometry Measurement in Large-Scale Optic-Electrical Theodolite

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Abstract:

Interferometry is a very important method in high accuracy measurement for optical system. This article briefly introduced the conception of interferometry and took a product of 4D Technology as an example to carry on the measurement. A large-scale optic-electrical Theodolite in assemblage was measured, and its primary mirror was 400mm in diameter. With the analysis of the results, some micro adjustments of the mechanical structure proceed, and it made the system perform better. The final results of the whole system is 1.061λ in P-V value and 0.1136λ in RMS value (λ=632.8nm), this meets the demand of optical design and practical application. The result demonstrates that interferometry is a good way to be utilized and optimize in the procedure of assemble.

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335-338

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February 2013

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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