[1]
Y. Martin and K. H. Wickramasinghe, Appl Phys Lett, 50, pp.1455-1457 (1987).
Google Scholar
[2]
Y. Martin, D. Rugar and K.H. Wickramasinghe, Appl Phys Lett, 52, pp.244-246 (1988).
Google Scholar
[3]
L. N. Vu, M. S. Wistrom, and D. J. Vanharkingen, Physica B, 194, p.1791 (1994).
Google Scholar
[4]
J. R. Kirtley, M. B. Ketchen, K. G. Stawiasz, J. Z. Sun, W. J. Gallagher, S. H. Blanton and S. J. Wind, Appl Phys Lett, 66, p.1138 (1995).
DOI: 10.1063/1.113838
Google Scholar
[5]
K. A. Moler, J. R. Kirtley, R. Liang, D. Bonn and W. H. Hardy, Phys Rev B, 55, p.12753 (1997).
Google Scholar
[6]
S. T. Yamamoto and S. Shultz, Appl Phys Lett, 69, p.3263 (1996).
Google Scholar
[7]
M. Nakamura, M. Kimura, K. Sueoka and K. Mukasa, Appl Phys Lett, 80, pp.2713-2715 (2002).
Google Scholar
[8]
A. M. Chang, H. D. Hallen, L. Harriot, H. F. Hess, H. L. Loa, J. Kao, R. E. Miller and T. Y. Chang, Appl Phys Lett, 61, p.1974, (1992).
Google Scholar
[9]
A. Oral, S. J. Bending and M. Henini, J. Vac. Sci. Technol. B, 14, pp.1202-1205 (1996).
Google Scholar
[10]
G. D. Howells, A. Oral, S. J. Bending, S. R. Andrews, P. T. Squire, P. Rice, A. de Lozanne, J. A. C. Bland, I. Kaya and M. Henini, J. Magnetism and Magnetic Materials, 196-197, pp.917-919 (1999).
DOI: 10.1016/s0304-8853(98)01002-6
Google Scholar
[11]
A. Sandhu, H. Masuda, A. Oral, S. J. Bending, A. Yamada and M. Konagai, Ultromicroscopy, 91, pp.97-101 (2002).
Google Scholar
[12]
A. Sandhu, N. Iida, H. Masuda, A. Oral and S. J. Bending, Magnetism and Magnetic Materials, 242-245, pp.1249-1252 (2002).
Google Scholar
[13]
A. Sandhu, A. Okamoto, I. Shibasaki and A. Oral, Microelectronic Engineering, 73-74, pp.524-528 (2004).
Google Scholar
[14]
Z. Primadani, H. Osawa and A. Sandhu, Journal of Applied Physics, 101, p. 09K105 -3 (2007).
Google Scholar
[15]
M. Dede, K. Ürkmen, Ö. Girisen, M. Atabak, A. Oral, I. Farrer and D. Ritchie, Journal of Nanoscience and Nanotechnology, 8, pp.619-622 (2008).
DOI: 10.1166/jnn.2008.a265
Google Scholar
[16]
A. Sandhu, H. Masuda, H. Senoguchi and K. Togawa, Nanotechnology, 15, pp. S410-S413 (2004).
Google Scholar
[17]
A. Sandhu, K. Kurosawa, M. Dede and A. Oral, Japanese Journal of Applied Physics, 43, pp.777-778 (2004).
Google Scholar
[18]
A. Sandhu, H. Masuda, and A. Oral, Journal of Applied Physics, 41, pp. L1402-L1405 (2002).
Google Scholar
[19]
K. Kida, H. Okano and H. Tanabe, Fatigue & Fracture of Engineering Materials & Structures, Vol. 32, 3, pp.180-188 (2009). doi: 10. 1111/j. 1460-2695. 2008. 01307. x.
DOI: 10.1111/j.1460-2695.2008.01307.x
Google Scholar
[20]
K. Kida, E. C. Santos, T. Honda, H. Koike and J. Rozwadowska, International Journal of Fatigue, Vol. 39, pp.38-43 (2012). doi: 10. 1016/j. ijfatigue. 2011. 05. 013.
Google Scholar
[21]
K. Kida, K, Santos, E. C., Honda, T. Honda and H. Tanabe, Proc. of SPIE-The International Society for Optical, 7522, SPIE 7522-307 (2010). doi: 75220u10. 1117/12. 851748.
Google Scholar
[22]
K. Kida, M. Uryu, T. Honda, E. C. Santos and K. Saruwatari, Advanced Materials Research, Vols. 457-458, pp.578-585, (2012). doi: 10. 4028/www. scientific. net/AMR. 457-458. 578.
DOI: 10.4028/scientific5/amr.457-458.578
Google Scholar
[23]
K. Kida, M. Uryu, T. Honda, E. C. Santos and K. Saruwatari, Applied Mechanics and Materials, Vols. 157 - 158, pp.1031-1037, (2012). doi: 10. 4028/www. scientific. net/AMM. 157-158. 1031.
DOI: 10.4028/www.scientific.net/amm.157-158.1031
Google Scholar
[24]
K. Kida, M. Uryu, T. Honda, E. C. Santos and K. Saruwatari, Advanced Materials Research, Vol. 566, pp.103-108. (2012). doi: 10. 4028/www. scientific. net/AMR. 566. 103.
DOI: 10.4028/www.scientific.net/amr.566.103
Google Scholar