Synchrotron-Radiation X-Ray Topography of the Rapid Grown KDP Crystals

Bing Teng; De Gao Zhong; Li Feng Cao; Shu Hua Wang; Xue Jun Jiang; Jiang Tao Ma; Shi Ming Zhang; Bing Tao Zhang; Wan Xia Huang

doi:10.4028/www.scientific.net/AMM.320.325

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vol. 320Synchrotron-Radiation X-Ray Topography of the...

Synchrotron-Radiation X-Ray Topography of the Rapid Grown KDP Crystals

Abstract:

KDP crystals were rapidly grown from point seeds by temperature reduction method. White-beam synchrotron radiation X-ray topography was used to study the growth imperfections in KDP crystals. Strong dislocation bunches originate on the prismatic faces of the seed were found. The producing reason of these dislocation bunches was discussed. Sector boundary between the prismatic sector and pyramid sector caused by the unbalance distribution of trivalent metal ions were also observed and analyzed.

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Periodical:

Applied Mechanics and Materials (Volume 320)

Pages:

325-328

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.320.325

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Online since:

May 2013

Authors:

Bing Teng, De Gao Zhong, Li Feng Cao, Shu Hua Wang, Xue Jun Jiang, Jiang Tao Ma, Shi Ming Zhang, Bing Tao Zhang, Wan Xia Huang

Keywords:

Defect, KDP Crystal, White-Beam Synchrotron Radiation X-Ray Topography

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References

[1] S. Seif, J.M. Chang, K. Bhat, B. Penn, R. B. Lal: Crystal Growth & Design, vol. 1(2001), p.359

Google Scholar

[2] N. Zaitseva and L. Carman, Prog. Cryst. Growth Charact, vol. 43 (2001), p.1

Google Scholar

[3] V.I. Salo , A.P. Voronov, V.F. Tkachenko, G.N. Babenko, A.V. Makoveev: J. Cryst. Growth, vol. 337(2011), p.13

Google Scholar

[4] P. Rajesh, S. Sreedhar, K. Boopathi, S. Venugopal Rao , P. Ramasamy: Current Applied Physics, vol. 11(2011), p.1343

DOI: 10.1016/j.cap.2011.03.076

Google Scholar

[5] T.N. Thomas, T.A. Land, T. Martin W.H. Casey and J.J. DeYoreo: J. Cryst. Growth, vol. 260(2004), p.566

Google Scholar

[6] H.F. Robey: J. Cryst. Growth, vol. 259(2003) 388.

Google Scholar

[7] Christopher K.Egan, AshutoshChoubey, MoretonMoore, RobertJ.Cernik: J. Cryst. Growth, vol. 343(2012), p.1

Google Scholar

[8] J. Gronkowski, E.Wierzbicka, M.Lefeld-Sosnowska, J.Borowski, J.H¨artwig: Radiation Physics and Chemistry, vol. 78 (2009), p. S58

DOI: 10.1016/j.radphyschem.2009.02.008

Google Scholar

[9] J.J. De Yoreo, Z.U. Rek, N.P. Zaitseva, B.W. Woods: J. Cryst. Growth, vol. 166(1999), p.291

Google Scholar

[10] I.L. Smolsky, A.E. Voloshin, N.P. Zaitseva, E.B. Rudneva and H. Klapper: Roy Soc of London Phil Tr A, vol. 357(1999)1761, p.2631

Google Scholar

[11] L.N. Rashkovich and N.V. Kronsky: J. Cryst. Growth, vol. 182 (1997) p.434

Google Scholar

[12] N. Zaitseva, L.Carman, I. Smolsky, R. Torres and M. Yan: J. Cryst. Growth, vol. 204(1999), p.512

Google Scholar