[1]
B. A. Capt B. P. Lepine, Wallaceand et al., NDT.net, Vol. 4, No. 1(1999).
Google Scholar
[2]
Mir-Saeed Safizadeh and et al., Aerospace Manufacturing Technology Conference & Exposition, September 2003, 2003-01-2916.
Google Scholar
[3]
H.-M. Thomas, M. Junger, H. Hintze, R. Krull, and S. Rühe, In: Proceedings of the 15th World Conference onNon-Destructive Testing, Rome, Italy, 2000.
Google Scholar
[4]
R. Pohl, R. Krull and R. Meierhofer, In: Proceedings of ECNDT 2006, Berlin, Germany, 2006.
Google Scholar
[5]
D. Zhou, B. Zhang, et al., Chinese Joournal of Scientific Instrument, Vol. 30, No. 6(2009), pp.1190-1194. (in Chinese)
Google Scholar
[6]
D. Schiller, T. Meier and D. Bical, NDT.net, Vol. 4, No. 1(1999).
Google Scholar
[7]
B. Oswald-Tranta, QIRT Journal, Vol. 1, No. 1(2004), pp.33-46.
Google Scholar
[8]
M. Junger, H.-M. Thomas, R. Krull and S. Rühe, In: Proceedings of the 16thWorldConference on Non-Destructive Testing, Montreal, Canada, August-September 2004.
Google Scholar
[9]
R. Pohl, A. Erhard, H.-J. Montag, H.-M. Thomas and H. Wüstenberg, NDT&E International, Vol. 37, Issue 2(2004), pp.89-94.
DOI: 10.1016/j.ndteint.2003.06.001
Google Scholar
[10]
R. S. Edwards, A. Sophian, S. Dixona, G.-Y. Tian, X. Jian, NDT&E International 39(2006), pp.45-52.
Google Scholar
[11]
Haddad, M. Zergoug, A. Hammouda, A. Benchaala, Information on http://www.epm.cnrs.fr/pages/interx/EPM2003/11/p.103.pdf
Google Scholar
[12]
A. Sophian, G.Y. Tian, D. Taylor and J. Rudlin, NDT&E International, Vol. 36, No. 1(2003), pp.37-41.
Google Scholar
[13]
D. Zhou, G. Y. Tian and et al., Nondestructive Testing and Evaluation, Vol. 25, Issue 2 (2010), doi: 10.1080/10589750802687580. pp.133-143.
Google Scholar
[14]
G. Y. Tian, A. Sophian, D. Taylor, J. Rudlin, Insight - Non-Destructive Testing and Condition Monitoring,Vol. 46, Issue 5 (2004), pp.256-259
DOI: 10.1784/insi.46.5.256.55559
Google Scholar
[15]
U. Netzelmann and G. Walle, 17th World Conference onNondestructive Testing, 25-28 Oct 2008, Shanghai, China.
Google Scholar
[16]
N. Tsopelas, N. J. Siakavellas, NDT&E International, Vol. 42, Issue 5 (2009), p.477–486.
Google Scholar
[17]
R. Al-Qubaa, G. Y. Tian, J. Wilson, W. L. Woo and S. S. Dlay, Meas. Sci. Technol. Vol. 21, Issue11 (2010) 115501 (11pp).
DOI: 10.1088/0957-0233/21/11/115501
Google Scholar
[18]
B. Oswald-Tranta, G. Wally, in: Proc. 9th European Conference on NDT, 25-29, Sept.2006, Berlin, p. We.3.8.32006. Loadable information on: http://www.ndt.net/article/ecndt2006/doc/ We.3.8.3.pdf.
Google Scholar
[19]
B. Oswald-Tranta, Journal of Nondestructive Testingand Evaluation, Vol. 22, No. 2-3(2007), pp.137-153.
Google Scholar
[20]
B. Oswald-Tranta, M. Sorger and P. O'Leary, J. Electron. Imaging, Vol. 19, Issue 3(2010), 031204, information on
DOI: 10.1117/1.3455991
Google Scholar
[21]
G. Walle and U. Netzelmann, in: Proc. 9th European Conference on NDT, 25-29, Sept. 2006, Berlin, ECNDT 2006 - Tu.4.8.5.
Google Scholar
[22]
J. Wilson, G. Y. Tian, I.Mukriz, D. Almond, NDT&E International, Vol. 44, Issue 6 (2011), pp.505-512.
Google Scholar
[23]
L. Cheng, G. Y. Tian, IEEE Sensors Journal, Vol. 11, No. 12(2011), pp.3261-3268.
Google Scholar
[24]
J. Wilson, G. Y. Tian, I. Z.Abidin, S. Yang and D. Almond, NondestructiveTesting and Evaluation, Vol. 25, Issue 3 (2010), pp.205-218.
DOI: 10.1080/10589750903242533
Google Scholar
[25]
S. Yang, G. Y. Tian, I. Z. Abidin and J. Wilson, Journal of Dynamic Systems, Measurement and Control, Vol. 133, Issue 1(2011), pp.011008-011013.
Google Scholar
[26]
P. Silvester, and R. L. Ferrari, Finite Elements for Electrical Engineers, 3rd ed., Cambridge University Press, Cambridge (1996).
Google Scholar