Sub-Pixel Measurement of the Cable Sheath Materials Thickness

Shu Lan Xia

doi:10.4028/www.scientific.net/AMM.333-335.1047

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 333-335Sub-Pixel Measurement of the Cable Sheath...

Sub-Pixel Measurement of the Cable Sheath Materials Thickness

Abstract:

Sub-pixel positioning is one of the key technologies which can achieve positioning better than entire pixel accuracy. The paper puts forward an improved Sobel-Zernike moment sub-pixel method based on ordinary Zernike moment method, which increase the algorithm speed while the algorithm accuracy remain basically unchanged. Then apply it to the cable sheath material thickness measurement, The experiment results indicate that the algorithm speed can be above 85% on a certain accuracy.

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Periodical:

Applied Mechanics and Materials (Volumes 333-335)

Pages:

1047-1050

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.333-335.1047

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Online since:

July 2013

Authors:

Shu Lan Xia*

Keywords:

Cable Sheath Material, Image Processing, Sobel-Zernike Moment Method, Sub-Pixel

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* - Corresponding Author

References

[1] Wang Hongna, Wang Qi. Image measuring technique and its applications. Electrical Measurement & Instrumentation, 2003(7): 19-21，In Chinese.

Google Scholar

[2] A. J. Tabatabai and O. R. Mitchell, Edge location to sub-pixel values in digital imagery, IEEE Trans, Pattern Anal, Machine Intell, vol. PAMI-6, no. 2, pp.188-201, Mar. (1984).

DOI: 10.1109/tpami.1984.4767502

Google Scholar

[3] Lyvers E P, Mitchell O R. Sub-pixel measurements using a moment-based edge operator. IEEE Transaction on Pattern Analysis and Machine Intelligence. 1989, 11(12): 1293-1308.

DOI: 10.1109/34.41367

Google Scholar

[4] The People's Republic of China national standard. Commen test methods for insulating and sheathing materials of electric cables. China: GB/T 2951. 1-1997, 1997, 10, 28.

Google Scholar