A Measurement System for Si1-xGex/Si Multi-Quantum Wells Film

Jia Yin Zhang; Tao Dong; Kai Ying Wang; Yan Su; Yong He

doi:10.4028/www.scientific.net/AMM.365-366.640

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 365-366A Measurement System for Si1-xGex/Si Multi-Quantum...

A Measurement System for Si_1-xGe_x/Si Multi-Quantum Wells Film

Abstract:

Si_1-xGe_x/Si multi-quantum wells (MQWs) film is excellent bolometer materials, which issensitive to radiation in the 8-14 micrometer wavelength region. As an important property,temperature coefficient of resistance (TCR) reflects the quality of infrared focal plane arrays.This paper designs a MQWs temperature and resistance data automatic measurement system basedon LABVIEW, and unifies data results, the characteristics of MQWs film was analyzed anddiscussed. The task is to examine the TCR for different material-compositions of MQWs.

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Periodical:

Applied Mechanics and Materials (Volumes 365-366)

Pages:

640-645

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.365-366.640

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Online since:

August 2013

Authors:

Jia Yin Zhang, Tao Dong, Kai Ying Wang, Yan Su, Yong He

Keywords:

Bolometer, Infrared, LabVIEW, SiGe/Si Multi-Quantum Wells

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