Study on Reliability Assessment of Degradation Date Based on Pseudo Life Distribution

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Abstract:

In order to develop the reliability assessment of high-reliability and long-lifetime products, analyses for accelerated degradation test is discussed in this article. First, a method of building degradation path is presented; second, the means of degradation data processing is analyzed; finally, an example is presented and validity of this method is verified.

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1499-1502

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September 2013

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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[1] M. B. Carey and R. H. Koenig. Reliability assessment based on accelerated degradation. IEEE Transaction on Reliability. Vol. 40(1991), p.499–506.

DOI: 10.1109/24.106763

Google Scholar

[2] W. Q. Meeker, L. A. Escobar, and C. J. Lu. Accelerated degradation tests: modeling and analysis. Techno metrics. Vol. 40(1998), p.89–99.

DOI: 10.1080/00401706.1998.10485191

Google Scholar

[3] Wu S J, Chang C T. Optimal design of degradation tests in presence of cost constraint. Reliability Engineering and System Safety. Vol. 76(2002), p.109–115.

DOI: 10.1016/s0951-8320(01)00123-5

Google Scholar

[4] Chen Z H, Liu Y S. Ecumenical model of reliability evaluation based on performance degradation data. Journal of Electronic Measurement and Instrument. P. 22-24, (2008).

Google Scholar

[5] Hong-Fwu Yu. Designing an accelerated degradation experiment with a reciprocal Weibull degradation rata. Journal of statistic planning and inference. Vol. 136(2006), pp.282-297.

DOI: 10.1016/j.jspi.2004.06.030

Google Scholar