Residual Stress Determination by X-Ray Diffraction with Stress of Two Directions Analysis Method

Abstract:

Residual stress determination by X-ray diffraction is theoretically analyzed. Using stress of two directions analysis method, the magnitude and direction of the principal stress which is induced by laser shocked wave can be calculated. The results indicate that the calculated value consists with that of the experimental data, which shows that the surface stresses state comprehensively. Meanwhile, the relationship between the principle stress and single stress with different energies are analyzed.

• Periodical: Applied Mechanics and Materials (Volume 43)
• Pages: 569-572
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.43.569
• Online since: December 2010
• Authors: Ai Xin Feng, Huai Yang Sun, Yu Peng Cao, Chuan Chao Xu, Gui Fen Ni, Jun Wei Wang, Peng Chen Zhou
• Keywords: Calculation, Residual Stress, Stress of Two Directions Analysis Method, X-Ray Diffraction (XRD)

References

[1] G.A. Sun, B. Chen: Nuclear Techniques Vol. 30(2007), p.286~289.

[2] J.F. Yang,　J.Z. Zhou ,　A.X. Feng: Applied laser Vol. 26(2006), p.157~162.

[3] B. Eigenmann, E. Macherauch: Mat-wiss U Werkstofftechnik Vol. 27(1996), pp.427-431.

[4] D.Q. Zhang: Physical Testing and Chemical Analysis Part A: Physical Testing Vol. 43(2007), p.263~265.

[5] D.Q. Zhang, J.W. He: Residual stress analysis by X-ray diffraction and its function (Xi'an Jiaotong University Press, Xi'an 1999).

[6] L. Ma, C. Wang: Resistance strain gauge and transducer technology (Chinese metrology press, Beijing 1993).

[7] G. Lin, H.G. Lin, Y.T. Zhao: Aluminum alloy application manual (China Machine Press, Beijing 2006).