Residual Stress Determination by X-Ray Diffraction with Stress of Two Directions Analysis Method

Abstract:

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Residual stress determination by X-ray diffraction is theoretically analyzed. Using stress of two directions analysis method, the magnitude and direction of the principal stress which is induced by laser shocked wave can be calculated. The results indicate that the calculated value consists with that of the experimental data, which shows that the surface stresses state comprehensively. Meanwhile, the relationship between the principle stress and single stress with different energies are analyzed.

Info:

Periodical:

Edited by:

Long Chen, Yongkang Zhang, Aixing Feng, Zhenying Xu, Boquan Li and Han Shen

Pages:

569-572

DOI:

10.4028/www.scientific.net/AMM.43.569

Citation:

A. X. Feng et al., "Residual Stress Determination by X-Ray Diffraction with Stress of Two Directions Analysis Method", Applied Mechanics and Materials, Vol. 43, pp. 569-572, 2011

Online since:

December 2010

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Price:

$35.00

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