A CMOS Integrated Circuit Parameter Testing Method Using LabVIEW

Xiao Bing Wu; Wan Quan Peng

doi:10.4028/www.scientific.net/AMM.443.53

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vol. 443A CMOS Integrated Circuit Parameter Testing Method...

A CMOS Integrated Circuit Parameter Testing Method Using LabVIEW

Abstract:

Software controlled measurement procedure, designed for testing of inverter integrated circuit voltage parameters, is presented in this paper. Described solution, performed on circuit HCF 4007 UB, is based on data acquisition PCI card NI 6713 and control programming application developed in LabVIEW 8.0 software environment, installed on standard. PC configuration. Designed solutions of virtual instruments performs measurements, chronological recording, graphical presentation and software analysis of measurement results regarding to input and output threshold voltage levels, from inverter transfer characteristic recorded for different circuit supply voltages. LabVIEW software support in the process of recording, measurement and software processing of the integrated circuit basic parameters, provides full software automation of these procedures.

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Periodical:

Applied Mechanics and Materials (Volume 443)

Pages:

53-57

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.443.53

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Online since:

October 2013

Authors:

Xiao Bing Wu, Wan Quan Peng

Keywords:

CMOS, Integrated Circuit, LabVIEW

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References

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